Incorporating network uncertainties in voltage dip state estimation

G. Ye (Corresponding author), M. Nijhuis, V. Cuk, J.F.G. Cobben

Onderzoeksoutput: Bijdrage aan tijdschriftTijdschriftartikelAcademicpeer review

Uittreksel

The magnitudes of voltage dips on non-monitored buses can be estimated by applying Bayes's theorem with measured voltage dips on a limited number of monitored buses. Bayes's theorem is used to obtain the grid conditions, including the network impedance, load, distributed generation vector, and short-circuit location, from which the voltage magnitudes along the feeder can be calculated. In order to implement this approach effectively, it is necessary to understand which parameters among the grid conditions are more significant for the estimation performance and how the uncertainties associated with these parameters affect the estimation results. Moreover, since the measurement structure provides observations to calculate the posterior distribution from the prior distribution of the grid conditions. The measurement parameters, quantities, and accuracy levels are varied in simulations to obtain an optimum measurement structure balancing between the cost and the measurement performance. This paper presented the results of the sensitivity studies which have been done on the IEEE 13-Bus and 123-Bus test systems. The results shows the performance of the voltage dip state estimation approach is less sensitive to the uncertainty level of the load while more sensitive to those of the DG, the short-circuit power, the zero sequence impedance of the cable and the short-circuit resistance. The voltage measurement accuracy is more important than that of current and phase angles. The proposed method shows much stronger robustness compared to the conventional one and the estimation performance can be improved through several measures, e.g. adding more measurement points.

TaalEngels
Pagina's888-896
Aantal pagina's9
TijdschriftInternational Journal of Electrical Power and Energy Systems
Volume113
DOI's
StatusGepubliceerd - 1 dec 2019

Vingerafdruk

State estimation
Short circuit currents
Electric potential
Voltage measurement
Distributed power generation
Cables
Uncertainty
Costs

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    Citeer dit

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    title = "Incorporating network uncertainties in voltage dip state estimation",
    abstract = "The magnitudes of voltage dips on non-monitored buses can be estimated by applying Bayes's theorem with measured voltage dips on a limited number of monitored buses. Bayes's theorem is used to obtain the grid conditions, including the network impedance, load, distributed generation vector, and short-circuit location, from which the voltage magnitudes along the feeder can be calculated. In order to implement this approach effectively, it is necessary to understand which parameters among the grid conditions are more significant for the estimation performance and how the uncertainties associated with these parameters affect the estimation results. Moreover, since the measurement structure provides observations to calculate the posterior distribution from the prior distribution of the grid conditions. The measurement parameters, quantities, and accuracy levels are varied in simulations to obtain an optimum measurement structure balancing between the cost and the measurement performance. This paper presented the results of the sensitivity studies which have been done on the IEEE 13-Bus and 123-Bus test systems. The results shows the performance of the voltage dip state estimation approach is less sensitive to the uncertainty level of the load while more sensitive to those of the DG, the short-circuit power, the zero sequence impedance of the cable and the short-circuit resistance. The voltage measurement accuracy is more important than that of current and phase angles. The proposed method shows much stronger robustness compared to the conventional one and the estimation performance can be improved through several measures, e.g. adding more measurement points.",
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    Incorporating network uncertainties in voltage dip state estimation. / Ye, G. (Corresponding author); Nijhuis, M.; Cuk, V.; Cobben, J.F.G.

    In: International Journal of Electrical Power and Energy Systems, Vol. 113, 01.12.2019, blz. 888-896.

    Onderzoeksoutput: Bijdrage aan tijdschriftTijdschriftartikelAcademicpeer review

    TY - JOUR

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    AU - Nijhuis,M.

    AU - Cuk,V.

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