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In situ transmission electron microscopy observations of individually selected freestanding carbon nanotubes during field emission

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Samenvatting

For the successful application of carbon nanotubes (CNTs) as electron sources in various applications it is important to understand the relation between the morphology of the CNT and its emission properties. A method was developed to study individual, freestanding and pre-selected CNTs with high-resolution transmission electron microscopy (TEM). The technique provided important parameters of the CNT, such as the number of carbon walls and the nature of its apex. The resolution with which the freestanding apices were imaged depended linearly on the ratio of the length and the radius. CNTs were also imaged in situ in the TEM while emitting electrons. It was found that the structure of a CNT was highly stable below a certain threshold emission current of typically 2 μA, while various structural changes occurred above the threshold, leading to either damaging or repair of the structure at the apex of the CNT.

Originele taal-2Engels
Pagina's (van-tot)902-908
Aantal pagina's7
TijdschriftUltramicroscopy
Volume106
Nummer van het tijdschrift10
DOI's
StatusGepubliceerd - 1 aug. 2006
Extern gepubliceerdJa

Financiering

We would like to thank K.B.K. Teo and W.I. Milne for the CVD CNT sample, A.G. Rinzler for providing the arc discharge CNT sample, M. Reyes–Reyes and Mauricio Terrones for the N-doped CNT sample, and M. Meuwese and M. van Wely Dieleman for designing the TEM specimen holder.

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