In situ optical probes of surface processes and interface formation during amorphous and epitaxial silicon thin film growth

W.M.M. Kessels

In situ optical probes of surface processes and interface formation during amorphous and epitaxial silicon thin film growth

W.M.M. Kessels

Onderzoeksoutput: Bijdrage aan congres › Other › Academic

Samenvatting

Abstract only.

Originele taal-2	Engels
Aantal pagina's	1
Status	Gepubliceerd - 2007
Evenement	22nd International Conference on Amorphous and Nanocrystalline Semiconductors, Breckenridge, USA - Breckenbridge, Verenigde Staten van Amerika Duur: 30 sep. 2007 → 30 sep. 2007 Congresnummer: 22

Congres

Congres	22nd International Conference on Amorphous and Nanocrystalline Semiconductors, Breckenridge, USA
Verkorte titel	ICANS 2007
Land/Regio	Verenigde Staten van Amerika
Stad	Breckenbridge
Periode	30/09/07 → 30/09/07
Ander	22nd International Conference on Amorphous and Nanocrystalline Semiconductors

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title = "In situ optical probes of surface processes and interface formation during amorphous and epitaxial silicon thin film growth",

abstract = "Abstract only.",

author = "W.M.M. Kessels",

year = "2007",

language = "English",

note = "22nd International Conference on Amorphous and Nanocrystalline Semiconductors (ICANS 2007), ICANS 2007 ; Conference date: 30-09-2007 Through 30-09-2007",

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TY - CONF

T1 - In situ optical probes of surface processes and interface formation during amorphous and epitaxial silicon thin film growth

AU - Kessels, W.M.M.

N1 - Conference code: 22

PY - 2007

Y1 - 2007

N2 - Abstract only.

AB - Abstract only.

M3 - Other

T2 - 22nd International Conference on Amorphous and Nanocrystalline Semiconductors (ICANS 2007)

Y2 - 30 September 2007 through 30 September 2007

ER -

In situ optical probes of surface processes and interface formation during amorphous and epitaxial silicon thin film growth

Samenvatting

Congres

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