@inproceedings{587aa61818334e88a1b27622a1abf788,
title = "In situ electrical resistance measurements of Al-Ge films in the TEM using a modified heating holder",
abstract = "A TEM specimen holder has been developed for the measurement of the electrical resistance of a TEM sample as a function of temperature. A Philips TEM heating holder was modified for this purpose. This creates the opportunity to directly correlate changes in the resistance to microstructural changes as a function of temperature. The microstructure of Al-Ge films of several thicknesses has been studied in an in-situ annealing experiment and has been recorded on videotape, while simultaneously acquiring resistance data. These in-situ TEM studies confirm that the irreversible decrease in resistance of these films is caused by crystallisation. During this transition segregation occurs, resulting in crystalline Al and Ge phases.",
author = "M.A. Verheijen and J.J.T.M. Donkers and J.F.P. Thomassen and \{Van den Broek\}, J.J. and \{van der Rijt\}, R.A.F. and M.J.J. Dona and C.M. Smit",
year = "2000",
month = dec,
day = "1",
doi = "10.1557/PROC-615-G6.1.1",
language = "English",
isbn = "1-55899-523-4",
series = "Materials Research Society Symposium - Proceedings",
publisher = "Materials Research Society",
editor = "B.M. Clemens and L. Gignac and J.M. Maclaren",
booktitle = "Polycrystalline metal and magnetic thin films -2000 : symposium held April 25-27, 2000, San Francisco, California, USA",
address = "United States",
note = "Polycrystalline Metal and Magnetic Thin Films-2000 ; Conference date: 25-04-2000 Through 27-04-2000",
}