Impact of silicon substrates, iron contamination and perimeter on saturation current and 1/f noise in n+p diodes

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Originele taal-2	Engels
Titel	Proc. 2nd ELEN Workshop
Pagina's	50201-50216
Status	Gepubliceerd - 1995
Evenement	2nd ELEN Workshop - Grenoble, Frankrijk Duur: 25 okt. 1995 → 27 okt. 1995

Congres	2nd ELEN Workshop
Land/Regio	Frankrijk
Stad	Grenoble
Periode	25/10/95 → 27/10/95
Ander	Proc. 2nd ELEN Workshop, Grenoble, France, October 1995

Citeer dit

@inproceedings{cd119b08b2d34d438d580d53d6a142d8,

title = "Impact of silicon substrates, iron contamination and perimeter on saturation current and 1/f noise in n+p diodes",

author = "L.K.J. Vandamme and E.P. Vandamme",

year = "1995",

language = "English",

pages = "50201--50216",

booktitle = "Proc. 2nd ELEN Workshop",

note = "2nd ELEN Workshop ; Conference date: 25-10-1995 Through 27-10-1995",

}