Impact of GHz disturbances on DC parametric measurements

H.P. Tuinhout, P.G.M. Baltus

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/CongresprocedureConferentiebijdrageAcademicpeer review

1 Citaat (Scopus)
72 Downloads (Pure)

Samenvatting

RF signals from mobile phones or WLAN transmitters can affect DC parametric measurements. A transistor test structure inside a wafer prober can behave as a GHz receiver when the needles or the manipulators that probe these transistors pick up sufficiently strong GHz signals. This paper shows examples of such occurrences and presents a technique for assessing the vulnerability of parametric measurement systems for GHz signals.
Originele taal-2Engels
TitelProceedings of the IEEE International Conference on Microelectronics Test Structures, 2006, ICMTS 2006, 6-9 March 2006, Austin, Texas
Plaats van productiePiscataway
UitgeverijInstitute of Electrical and Electronics Engineers
Pagina's71-75
ISBN van geprinte versie1-4244-0167-4
DOI's
StatusGepubliceerd - 2006
Evenementconference; International Conference on Microelectronics Test Structures, March 2006 -
Duur: 1 jan. 2006 → …

Congres

Congresconference; International Conference on Microelectronics Test Structures, March 2006
Periode1/01/06 → …
AnderInternational Conference on Microelectronics Test Structures, March 2006

Vingerafdruk

Duik in de onderzoeksthema's van 'Impact of GHz disturbances on DC parametric measurements'. Samen vormen ze een unieke vingerafdruk.

Citeer dit