Immunity analysis of an LDO using identification of operating region transitions

Lammert Duipmans, Dusan Milosevic, Arnoud van der Wel, Ravi Karadi, Peter Baltus

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/CongresprocedureConferentiebijdrageAcademicpeer review

1 Citaat (Scopus)

Uittreksel

DC operating point shifts due to Electromagnetic Interference (EMI) are a major cause of EM immunity failures. Accurate analysis of such nonlinear effects demands the use of time-consuming simulations that are not practical for large-scale circuits. A method is presented that points to the causes of immunity failures by identifying devices that show strongly nonlinear behavior as a result of operating region transitions. It does this without using time-consuming simulations. To further relax the requirements on computational power of the simulator, the method splits the circuit into smaller sub-circuits that are each characterized by small-signal linear models. Using these models, interference propagation through the chip can be estimated. A tool based on the proposed method is implemented and applied to a large-scale test circuit of a Low-Dropout (LDO) regulator.

TaalEngels
Titel2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility, EMC/APEMC 2018
Plaats van productiePiscataway
UitgeverijInstitute of Electrical and Electronics Engineers
Pagina's701-706
Aantal pagina's6
ISBN van elektronische versie9781509059973
DOI's
StatusGepubliceerd - 22 jun 2018
Evenement60th IEEE International Symposium on Electromagnetic Compatibility and 9th IEEE Asia-Pacific Symposium on Electromagnetic Compatibility, EMC/APEMC 2018 - Suntec City, Singapore
Duur: 14 mei 201818 mei 2018

Congres

Congres60th IEEE International Symposium on Electromagnetic Compatibility and 9th IEEE Asia-Pacific Symposium on Electromagnetic Compatibility, EMC/APEMC 2018
LandSingapore
StadSuntec City
Periode14/05/1818/05/18

Vingerafdruk

dropouts
immunity
Networks (circuits)
electromagnetic interference
causes
regulators
Signal interference
simulators
simulation
Simulators
direct current
chips
interference
requirements
propagation
shift

Trefwoorden

    Citeer dit

    Duipmans, L., Milosevic, D., van der Wel, A., Karadi, R., & Baltus, P. (2018). Immunity analysis of an LDO using identification of operating region transitions. In 2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility, EMC/APEMC 2018 (blz. 701-706). Piscataway: Institute of Electrical and Electronics Engineers. DOI: 10.1109/ISEMC.2018.8393872
    Duipmans, Lammert ; Milosevic, Dusan ; van der Wel, Arnoud ; Karadi, Ravi ; Baltus, Peter. / Immunity analysis of an LDO using identification of operating region transitions. 2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility, EMC/APEMC 2018. Piscataway : Institute of Electrical and Electronics Engineers, 2018. blz. 701-706
    @inproceedings{a599966866824acf870ee2adcc208702,
    title = "Immunity analysis of an LDO using identification of operating region transitions",
    abstract = "DC operating point shifts due to Electromagnetic Interference (EMI) are a major cause of EM immunity failures. Accurate analysis of such nonlinear effects demands the use of time-consuming simulations that are not practical for large-scale circuits. A method is presented that points to the causes of immunity failures by identifying devices that show strongly nonlinear behavior as a result of operating region transitions. It does this without using time-consuming simulations. To further relax the requirements on computational power of the simulator, the method splits the circuit into smaller sub-circuits that are each characterized by small-signal linear models. Using these models, interference propagation through the chip can be estimated. A tool based on the proposed method is implemented and applied to a large-scale test circuit of a Low-Dropout (LDO) regulator.",
    keywords = "Direct Power Injection (DPI), Electromagnetic Compatibility (EMC), EMI, LDO, Operating region transition, Small-signal model, Strongly nonlinear behavior",
    author = "Lammert Duipmans and Dusan Milosevic and {van der Wel}, Arnoud and Ravi Karadi and Peter Baltus",
    year = "2018",
    month = "6",
    day = "22",
    doi = "10.1109/ISEMC.2018.8393872",
    language = "English",
    pages = "701--706",
    booktitle = "2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility, EMC/APEMC 2018",
    publisher = "Institute of Electrical and Electronics Engineers",
    address = "United States",

    }

    Duipmans, L, Milosevic, D, van der Wel, A, Karadi, R & Baltus, P 2018, Immunity analysis of an LDO using identification of operating region transitions. in 2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility, EMC/APEMC 2018. Institute of Electrical and Electronics Engineers, Piscataway, blz. 701-706, Suntec City, Singapore, 14/05/18. DOI: 10.1109/ISEMC.2018.8393872

    Immunity analysis of an LDO using identification of operating region transitions. / Duipmans, Lammert; Milosevic, Dusan; van der Wel, Arnoud; Karadi, Ravi; Baltus, Peter.

    2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility, EMC/APEMC 2018. Piscataway : Institute of Electrical and Electronics Engineers, 2018. blz. 701-706.

    Onderzoeksoutput: Hoofdstuk in Boek/Rapport/CongresprocedureConferentiebijdrageAcademicpeer review

    TY - GEN

    T1 - Immunity analysis of an LDO using identification of operating region transitions

    AU - Duipmans,Lammert

    AU - Milosevic,Dusan

    AU - van der Wel,Arnoud

    AU - Karadi,Ravi

    AU - Baltus,Peter

    PY - 2018/6/22

    Y1 - 2018/6/22

    N2 - DC operating point shifts due to Electromagnetic Interference (EMI) are a major cause of EM immunity failures. Accurate analysis of such nonlinear effects demands the use of time-consuming simulations that are not practical for large-scale circuits. A method is presented that points to the causes of immunity failures by identifying devices that show strongly nonlinear behavior as a result of operating region transitions. It does this without using time-consuming simulations. To further relax the requirements on computational power of the simulator, the method splits the circuit into smaller sub-circuits that are each characterized by small-signal linear models. Using these models, interference propagation through the chip can be estimated. A tool based on the proposed method is implemented and applied to a large-scale test circuit of a Low-Dropout (LDO) regulator.

    AB - DC operating point shifts due to Electromagnetic Interference (EMI) are a major cause of EM immunity failures. Accurate analysis of such nonlinear effects demands the use of time-consuming simulations that are not practical for large-scale circuits. A method is presented that points to the causes of immunity failures by identifying devices that show strongly nonlinear behavior as a result of operating region transitions. It does this without using time-consuming simulations. To further relax the requirements on computational power of the simulator, the method splits the circuit into smaller sub-circuits that are each characterized by small-signal linear models. Using these models, interference propagation through the chip can be estimated. A tool based on the proposed method is implemented and applied to a large-scale test circuit of a Low-Dropout (LDO) regulator.

    KW - Direct Power Injection (DPI)

    KW - Electromagnetic Compatibility (EMC)

    KW - EMI

    KW - LDO

    KW - Operating region transition

    KW - Small-signal model

    KW - Strongly nonlinear behavior

    UR - http://www.scopus.com/inward/record.url?scp=85050072227&partnerID=8YFLogxK

    U2 - 10.1109/ISEMC.2018.8393872

    DO - 10.1109/ISEMC.2018.8393872

    M3 - Conference contribution

    SP - 701

    EP - 706

    BT - 2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility, EMC/APEMC 2018

    PB - Institute of Electrical and Electronics Engineers

    CY - Piscataway

    ER -

    Duipmans L, Milosevic D, van der Wel A, Karadi R, Baltus P. Immunity analysis of an LDO using identification of operating region transitions. In 2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility, EMC/APEMC 2018. Piscataway: Institute of Electrical and Electronics Engineers. 2018. blz. 701-706. Beschikbaar vanaf, DOI: 10.1109/ISEMC.2018.8393872