Identifying EMC-critical devices by monitoring and classifying operating region transitions

L.J. Duipmans; D. Milosevic; A. Van Der Wel; P.G.M. Baltus

doi:10.1109/EMCCompo.2017.7998073

Identifying EMC-critical devices by monitoring and classifying operating region transitions

L.J. Duipmans, D. Milosevic, A. Van Der Wel, P.G.M. Baltus

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/Congresprocedure › Conferentiebijdrage › Academic › peer review

3 Citaten (Scopus)

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In many nonlinear circuits, DC operating points may shift when the circuit is subjected to Electromagnetic Interference (EMI), leading to Electromagnetic Compatibility (EMC) failures. Analysis of such failures is classically done using a transient simulation of the whole circuit. For large circuits, this method is not practical due to computational limitations. This paper proposes a computationally inexpensive method that is able to analyze very large-scale circuits and to identify the devices that suffer from strongly nonlinear behavior in the presence of EMI. It does so by checking which devices suffer from operating region transitions. Next, it classifies these transitions to prioritize the devices in terms of their contribution to the EMI problem. The method is demonstrated to work well on a level shifter circuit, a representative case that is widely used in commercial products.

Originele taal-2	Engels
Titel	Proceedings of the 2017 11th International Workshop on the Electromagnetic Compatibility of Integrated Circuits, EMCCompo 2017, 4-8 July 2017, St. Petersburg, Russia
Plaats van productie	Piscataway
Uitgeverij	Institute of Electrical and Electronics Engineers
Pagina's	9-14
Aantal pagina's	6
ISBN van elektronische versie	978-1-5386-2689-4
ISBN van geprinte versie	978-1-5386-2690-0
DOI's	https://doi.org/10.1109/EMCCompo.2017.7998073
Status	Gepubliceerd - 31 jul. 2017
Evenement	11th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo 2017) - St. Petersburg, Rusland Duur: 4 jul. 2017 → 8 jul. 2017 https://emccompo2017.eltech.ru/

Congres

Congres	11th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo 2017)
Land/Regio	Rusland
Stad	St. Petersburg
Periode	4/07/17 → 8/07/17
Internet adres	https://emccompo2017.eltech.ru/

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10.1109/EMCCompo.2017.7998073

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Duipmans, L. J., Milosevic, D., Van Der Wel, A., & Baltus, P. G. M. (2017). Identifying EMC-critical devices by monitoring and classifying operating region transitions. In Proceedings of the 2017 11th International Workshop on the Electromagnetic Compatibility of Integrated Circuits, EMCCompo 2017, 4-8 July 2017, St. Petersburg, Russia (blz. 9-14). Article 7998073 Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/EMCCompo.2017.7998073

Duipmans, L.J. ; Milosevic, D. ; Van Der Wel, A. et al. / Identifying EMC-critical devices by monitoring and classifying operating region transitions. Proceedings of the 2017 11th International Workshop on the Electromagnetic Compatibility of Integrated Circuits, EMCCompo 2017, 4-8 July 2017, St. Petersburg, Russia. Piscataway : Institute of Electrical and Electronics Engineers, 2017. blz. 9-14

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title = "Identifying EMC-critical devices by monitoring and classifying operating region transitions",

abstract = "In many nonlinear circuits, DC operating points may shift when the circuit is subjected to Electromagnetic Interference (EMI), leading to Electromagnetic Compatibility (EMC) failures. Analysis of such failures is classically done using a transient simulation of the whole circuit. For large circuits, this method is not practical due to computational limitations. This paper proposes a computationally inexpensive method that is able to analyze very large-scale circuits and to identify the devices that suffer from strongly nonlinear behavior in the presence of EMI. It does so by checking which devices suffer from operating region transitions. Next, it classifies these transitions to prioritize the devices in terms of their contribution to the EMI problem. The method is demonstrated to work well on a level shifter circuit, a representative case that is widely used in commercial products.",

keywords = "Direct Power Injection (DPI), EMC, EMI, immunity, level shifter, strongly nonlinear behavior",

author = "L.J. Duipmans and D. Milosevic and {Van Der Wel}, A. and P.G.M. Baltus",

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Duipmans, LJ, Milosevic, D, Van Der Wel, A & Baltus, PGM 2017, Identifying EMC-critical devices by monitoring and classifying operating region transitions. in Proceedings of the 2017 11th International Workshop on the Electromagnetic Compatibility of Integrated Circuits, EMCCompo 2017, 4-8 July 2017, St. Petersburg, Russia., 7998073, Institute of Electrical and Electronics Engineers, Piscataway, blz. 9-14, 11th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo 2017), St. Petersburg, Rusland, 4/07/17. https://doi.org/10.1109/EMCCompo.2017.7998073

Identifying EMC-critical devices by monitoring and classifying operating region transitions. / Duipmans, L.J.; Milosevic, D.; Van Der Wel, A. et al.
Proceedings of the 2017 11th International Workshop on the Electromagnetic Compatibility of Integrated Circuits, EMCCompo 2017, 4-8 July 2017, St. Petersburg, Russia. Piscataway: Institute of Electrical and Electronics Engineers, 2017. blz. 9-14 7998073.

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/Congresprocedure › Conferentiebijdrage › Academic › peer review

TY - GEN

T1 - Identifying EMC-critical devices by monitoring and classifying operating region transitions

AU - Duipmans, L.J.

AU - Milosevic, D.

AU - Van Der Wel, A.

AU - Baltus, P.G.M.

PY - 2017/7/31

Y1 - 2017/7/31

N2 - In many nonlinear circuits, DC operating points may shift when the circuit is subjected to Electromagnetic Interference (EMI), leading to Electromagnetic Compatibility (EMC) failures. Analysis of such failures is classically done using a transient simulation of the whole circuit. For large circuits, this method is not practical due to computational limitations. This paper proposes a computationally inexpensive method that is able to analyze very large-scale circuits and to identify the devices that suffer from strongly nonlinear behavior in the presence of EMI. It does so by checking which devices suffer from operating region transitions. Next, it classifies these transitions to prioritize the devices in terms of their contribution to the EMI problem. The method is demonstrated to work well on a level shifter circuit, a representative case that is widely used in commercial products.

AB - In many nonlinear circuits, DC operating points may shift when the circuit is subjected to Electromagnetic Interference (EMI), leading to Electromagnetic Compatibility (EMC) failures. Analysis of such failures is classically done using a transient simulation of the whole circuit. For large circuits, this method is not practical due to computational limitations. This paper proposes a computationally inexpensive method that is able to analyze very large-scale circuits and to identify the devices that suffer from strongly nonlinear behavior in the presence of EMI. It does so by checking which devices suffer from operating region transitions. Next, it classifies these transitions to prioritize the devices in terms of their contribution to the EMI problem. The method is demonstrated to work well on a level shifter circuit, a representative case that is widely used in commercial products.

KW - Direct Power Injection (DPI)

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KW - EMI

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Y2 - 4 July 2017 through 8 July 2017

ER -

Duipmans LJ, Milosevic D, Van Der Wel A, Baltus PGM. Identifying EMC-critical devices by monitoring and classifying operating region transitions. In Proceedings of the 2017 11th International Workshop on the Electromagnetic Compatibility of Integrated Circuits, EMCCompo 2017, 4-8 July 2017, St. Petersburg, Russia. Piscataway: Institute of Electrical and Electronics Engineers. 2017. blz. 9-14. 7998073 doi: 10.1109/EMCCompo.2017.7998073

Identifying EMC-critical devices by monitoring and classifying operating region transitions

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