Identifying EMC-critical devices by monitoring and classifying operating region transitions

L.J. Duipmans, D. Milosevic, A. Van Der Wel, P.G.M. Baltus

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/CongresprocedureConferentiebijdrageAcademicpeer review

3 Citaten (Scopus)
1 Downloads (Pure)

Samenvatting

In many nonlinear circuits, DC operating points may shift when the circuit is subjected to Electromagnetic Interference (EMI), leading to Electromagnetic Compatibility (EMC) failures. Analysis of such failures is classically done using a transient simulation of the whole circuit. For large circuits, this method is not practical due to computational limitations. This paper proposes a computationally inexpensive method that is able to analyze very large-scale circuits and to identify the devices that suffer from strongly nonlinear behavior in the presence of EMI. It does so by checking which devices suffer from operating region transitions. Next, it classifies these transitions to prioritize the devices in terms of their contribution to the EMI problem. The method is demonstrated to work well on a level shifter circuit, a representative case that is widely used in commercial products.

Originele taal-2Engels
TitelProceedings of the 2017 11th International Workshop on the Electromagnetic Compatibility of Integrated Circuits, EMCCompo 2017, 4-8 July 2017, St. Petersburg, Russia
Plaats van productiePiscataway
UitgeverijInstitute of Electrical and Electronics Engineers
Pagina's9-14
Aantal pagina's6
ISBN van elektronische versie978-1-5386-2689-4
ISBN van geprinte versie978-1-5386-2690-0
DOI's
StatusGepubliceerd - 31 jul. 2017
Evenement11th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo 2017) - St. Petersburg, Rusland
Duur: 4 jul. 20178 jul. 2017
https://emccompo2017.eltech.ru/

Congres

Congres11th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo 2017)
Land/RegioRusland
StadSt. Petersburg
Periode4/07/178/07/17
Internet adres

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