High quality ultrafast transmission electron microscopy using resonant microwave cavities

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Ultrashort, low-emittance electron pulses can be created at a high repetition rate by using a TM110 deflection cavity to sweep a continuous beam across an aperture. These pulses can be used for time-resolved electron microscopy with atomic spatial and temporal resolution at relatively large average currents. In order to demonstrate this, a cavity has been inserted in a transmission electron microscope, and picosecond pulses have been created. No significant increase of either emittance or energy spread has been measured for these pulses. At a peak current of 814 ± 2 pA, the root-mean-square transverse normalized emittance of the electron pulses is ɛn,x=(2.7±0.1)·10−12 m rad in the direction parallel to the streak of the cavity, and ɛn,y=(2.5±0.1)·10−12 m rad in the perpendicular direction for pulses with a pulse length of 1.1–1.3 ps. Under the same conditions, the emittance of the continuous beam is ɛn,xn,y=(2.5±0.1)·10−12 m rad. Furthermore, for both the pulsed and the continuous beam a full width at half maximum energy spread of 0.95 ± 0.05 eV has been measured.

TaalEngels
Pagina's85-89
Aantal pagina's5
TijdschriftUltramicroscopy
Volume188
DOI's
StatusGepubliceerd - 1 mei 2018

Vingerafdruk

Microwaves
Transmission electron microscopy
emittance
microwaves
transmission electron microscopy
cavities
Electrons
Full width at half maximum
pulses
Electron microscopy
Electron microscopes
picosecond pulses
temporal resolution
Direction compound
deflection
repetition
electron microscopy
electrons
electron microscopes
spatial resolution

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    Citeer dit

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    title = "High quality ultrafast transmission electron microscopy using resonant microwave cavities",
    abstract = "Ultrashort, low-emittance electron pulses can be created at a high repetition rate by using a TM110 deflection cavity to sweep a continuous beam across an aperture. These pulses can be used for time-resolved electron microscopy with atomic spatial and temporal resolution at relatively large average currents. In order to demonstrate this, a cavity has been inserted in a transmission electron microscope, and picosecond pulses have been created. No significant increase of either emittance or energy spread has been measured for these pulses. At a peak current of 814 ± 2 pA, the root-mean-square transverse normalized emittance of the electron pulses is ɛn,x=(2.7±0.1)·10−12 m rad in the direction parallel to the streak of the cavity, and ɛn,y=(2.5±0.1)·10−12 m rad in the perpendicular direction for pulses with a pulse length of 1.1–1.3 ps. Under the same conditions, the emittance of the continuous beam is ɛn,x=ɛn,y=(2.5±0.1)·10−12 m rad. Furthermore, for both the pulsed and the continuous beam a full width at half maximum energy spread of 0.95 ± 0.05 eV has been measured.",
    keywords = "Coherent ultrashort electron pulses, Microwave cavities, Pump–probe, Ultrafast transmission electron microscopy",
    author = "W. Verhoeven and {van Rens}, J.F.M. and E.R. Kieft and P.H.A. Mutsaers and O.J. Luiten",
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    High quality ultrafast transmission electron microscopy using resonant microwave cavities. / Verhoeven, W.; van Rens, J.F.M.; Kieft, E.R.; Mutsaers, P.H.A.; Luiten, O.J.

    In: Ultramicroscopy, Vol. 188, 01.05.2018, blz. 85-89.

    Onderzoeksoutput: Bijdrage aan tijdschriftTijdschriftartikelAcademicpeer review

    TY - JOUR

    T1 - High quality ultrafast transmission electron microscopy using resonant microwave cavities

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    AU - van Rens,J.F.M.

    AU - Kieft,E.R.

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    KW - Coherent ultrashort electron pulses

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