Full-field stress-strain mapping of micron-sized structures using FEM-based integrated global digital image correlation

J.P.M. Hoefnagels; J. Neggers; F. Hild; S. Roux; J. Beeck, van; M.G.D. Geers

Full-field stress-strain mapping of micron-sized structures using FEM-based integrated global digital image correlation

J.P.M. Hoefnagels, J. Neggers, F. Hild, S. Roux, J. Beeck, van, M.G.D. Geers

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/Congresprocedure › Conferentiebijdrage › Academic › peer review

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A FEM-based Integrated Quasi-3D Global Digital Image Correlation methodology is developed that directly correlates high-resolution profilometry maps of micron-sized structures, which are loaded by stretching their underlying substrates, to yield full-field continuous stress and strain maps of the deforming structures. The technique shows clear potential as a generic mechanical testing technique of miniature structures of complex three-dimensional shape in the same micro-structural configuration as used in their application.

Originele taal-2	Engels
Titel	Proceedings of PhotoMechanics 2013 – International conference on full-field measurement techniques and their applications in experimental solid mechanics 27-19 May 2013, Montpellier, France
Redacteuren	A Chrysochoos, H. Louche, B. Wattrisse
Pagina's	USB flash drive-
Status	Gepubliceerd - 2013
Evenement	2013 PhotoMechanics - Montpellier, Frankrijk Duur: 27 mei 2013 → 29 mei 2013

Congres

Congres	2013 PhotoMechanics
Land/Regio	Frankrijk
Stad	Montpellier
Periode	27/05/13 → 29/05/13
Ander	PhotoMechanics 2013 – International conference on full-field measurement techniques and their applications in experimental solid mechanics, Montpellier, France

Citeer dit

Hoefnagels, J. P. M., Neggers, J., Hild, F., Roux, S., Beeck, van, J., & Geers, M. G. D. (2013). Full-field stress-strain mapping of micron-sized structures using FEM-based integrated global digital image correlation. In A. Chrysochoos, H. Louche, & B. Wattrisse (editors), Proceedings of PhotoMechanics 2013 – International conference on full-field measurement techniques and their applications in experimental solid mechanics 27-19 May 2013, Montpellier, France (blz. USB flash drive-)

Hoefnagels, J.P.M. ; Neggers, J. ; Hild, F. et al. / Full-field stress-strain mapping of micron-sized structures using FEM-based integrated global digital image correlation. Proceedings of PhotoMechanics 2013 – International conference on full-field measurement techniques and their applications in experimental solid mechanics 27-19 May 2013, Montpellier, France. redacteur / A Chrysochoos ; H. Louche ; B. Wattrisse. 2013. blz. USB flash drive-

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title = "Full-field stress-strain mapping of micron-sized structures using FEM-based integrated global digital image correlation",

abstract = "A FEM-based Integrated Quasi-3D Global Digital Image Correlation methodology is developed that directly correlates high-resolution profilometry maps of micron-sized structures, which are loaded by stretching their underlying substrates, to yield full-field continuous stress and strain maps of the deforming structures. The technique shows clear potential as a generic mechanical testing technique of miniature structures of complex three-dimensional shape in the same micro-structural configuration as used in their application.",

author = "J.P.M. Hoefnagels and J. Neggers and F. Hild and S. Roux and {Beeck, van}, J. and M.G.D. Geers",

year = "2013",

language = "English",

pages = "USB flash drive--",

editor = "A Chrysochoos and H. Louche and B. Wattrisse",

booktitle = "Proceedings of PhotoMechanics 2013 – International conference on full-field measurement techniques and their applications in experimental solid mechanics 27-19 May 2013, Montpellier, France",

note = "2013 PhotoMechanics ; Conference date: 27-05-2013 Through 29-05-2013",

}

Hoefnagels, JPM, Neggers, J, Hild, F, Roux, S, Beeck, van, J & Geers, MGD 2013, Full-field stress-strain mapping of micron-sized structures using FEM-based integrated global digital image correlation. in A Chrysochoos, H Louche & B Wattrisse (uitgave), Proceedings of PhotoMechanics 2013 – International conference on full-field measurement techniques and their applications in experimental solid mechanics 27-19 May 2013, Montpellier, France. blz. USB flash drive-, 2013 PhotoMechanics, Montpellier, Frankrijk, 27/05/13.

Full-field stress-strain mapping of micron-sized structures using FEM-based integrated global digital image correlation. / Hoefnagels, J.P.M.; Neggers, J.; Hild, F. et al.
Proceedings of PhotoMechanics 2013 – International conference on full-field measurement techniques and their applications in experimental solid mechanics 27-19 May 2013, Montpellier, France. uitgave / A Chrysochoos; H. Louche; B. Wattrisse. 2013. blz. USB flash drive-.

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/Congresprocedure › Conferentiebijdrage › Academic › peer review

TY - GEN

T1 - Full-field stress-strain mapping of micron-sized structures using FEM-based integrated global digital image correlation

AU - Hoefnagels, J.P.M.

AU - Neggers, J.

AU - Hild, F.

AU - Roux, S.

AU - Beeck, van, J.

AU - Geers, M.G.D.

PY - 2013

Y1 - 2013

N2 - A FEM-based Integrated Quasi-3D Global Digital Image Correlation methodology is developed that directly correlates high-resolution profilometry maps of micron-sized structures, which are loaded by stretching their underlying substrates, to yield full-field continuous stress and strain maps of the deforming structures. The technique shows clear potential as a generic mechanical testing technique of miniature structures of complex three-dimensional shape in the same micro-structural configuration as used in their application.

AB - A FEM-based Integrated Quasi-3D Global Digital Image Correlation methodology is developed that directly correlates high-resolution profilometry maps of micron-sized structures, which are loaded by stretching their underlying substrates, to yield full-field continuous stress and strain maps of the deforming structures. The technique shows clear potential as a generic mechanical testing technique of miniature structures of complex three-dimensional shape in the same micro-structural configuration as used in their application.

M3 - Conference contribution

SP - USB flash drive-

BT - Proceedings of PhotoMechanics 2013 – International conference on full-field measurement techniques and their applications in experimental solid mechanics 27-19 May 2013, Montpellier, France

A2 - Chrysochoos, A

A2 - Louche, H.

A2 - Wattrisse, B.

T2 - 2013 PhotoMechanics

Y2 - 27 May 2013 through 29 May 2013

ER -

Hoefnagels JPM, Neggers J, Hild F, Roux S, Beeck, van J, Geers MGD. Full-field stress-strain mapping of micron-sized structures using FEM-based integrated global digital image correlation. In Chrysochoos A, Louche H, Wattrisse B, redacteurs, Proceedings of PhotoMechanics 2013 – International conference on full-field measurement techniques and their applications in experimental solid mechanics 27-19 May 2013, Montpellier, France. 2013. blz. USB flash drive-

Full-field stress-strain mapping of micron-sized structures using FEM-based integrated global digital image correlation

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