Field emission to control tip-sample distance in magnetic probe recording

A.J. Fèbre, Le, R. Luttge, L. Abelmann, J.C. Lodder

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Samenvatting

An integrated method using field-emission to control the tip-sample distance for non-contact magnetic probe recording is presented, adopting the exponential relation between current and electric field as feedback. I/V characteristics that correspond well to field emission theory are measured using a probe coated with a 100 nm conductive diamond layer. By using feedback to control the tip-sample distance at constant current, the distance was increased by 2.8 nm per volt applied bias. The method was tested by scanning a probe coated with 20 nm chromium over a conducting nanopatterned sample, at bias voltages of 0.5V, 5.0V and 50.0V. The measurements confirm that field emission can be applied to control the tip-sample distance, with sufficient resolution and current stability for magnetic probe recording. © 2007 IOP Publishing Ltd.
Originele taal-2Engels
Pagina's (van-tot)673-677
TijdschriftJournal of Physics: Conference Series
Volume61
Nummer van het tijdschrift1
DOI's
StatusGepubliceerd - 2007

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