Fatigue damage modeling in solder interconnects using a cohesive zone approach

The objective of this work is to model the fatigue damage process in a solder bump subjected to cyclic loading conditions. Fatigue damage is simulated using the cohesive zone methodology. Damage is assumed to occur at interfaces modeled through cohesive zones in the material, while the bulk material is assumed to be linear elastic. The state of damage at a cohesive zone is incorporated into the cohesive zone constitutive law by a elasticity-based damage variable. The gradual degradation of the solder material and the corresponding damage accumulation throughout the cycling process is accounted for by a damage evolution law which captures the main damage characteristics. The model prediction of the solder bump life-time is shown to be in good agreement with one of the commonly used empirical life-time prediction laws.