Fast time-domain simulation for reliable fault detection

Bratislav Tasić, Jos J. Dohmen, Rick Janssen, E. Jan W. ter Maten, Theo G.J. Beelen, Roland Pulch

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/CongresprocedureConferentiebijdrageAcademicpeer review

2 Citaten (Scopus)

Samenvatting

Imperfections in manufacturing processes may cause unwanted connections (faults) that are added to the nominal, "golden", design of an electronic circuit. By fault simulation we simulate all situations: a huge number of new connections and each with many different values, up to the regime of large deviations, for the newly added element. We also consider "opens" (broken connections). A strategy is developed to efficiently simulate the faulty solutions until their moment of detection. We fully exploit the hierarchical structure of the circuit. Fast fault simulation is achieved in which the golden solution and all faulty solutions are calculated over the same time step.

Originele taal-2Engels
TitelProceedings of the 2016 Design, Automation and Test in Europe Conference and Exhibition, DATE 2016
Plaats van productiePiscataway
UitgeverijInstitute of Electrical and Electronics Engineers
Pagina's301-306
Aantal pagina's6
ISBN van elektronische versie9783981537062
StatusGepubliceerd - 25 apr 2016
Evenement19th Design, Automation and Test in Europe Conference and Exhibition, DATE 2016 - ICC, Dresden, Duitsland
Duur: 14 mrt 201618 mrt 2016
Congresnummer: 19
https://www.date-conference.com/date16/

Congres

Congres19th Design, Automation and Test in Europe Conference and Exhibition, DATE 2016
Verkorte titelDATE 2016
LandDuitsland
StadDresden
Periode14/03/1618/03/16
Internet adres

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  • Citeer dit

    Tasić, B., Dohmen, J. J., Janssen, R., ter Maten, E. J. W., Beelen, T. G. J., & Pulch, R. (2016). Fast time-domain simulation for reliable fault detection. In Proceedings of the 2016 Design, Automation and Test in Europe Conference and Exhibition, DATE 2016 (blz. 301-306). [7459327] Institute of Electrical and Electronics Engineers.