Failure modelling in flexible electronics

Engineering

• Thin-Film Transistor 100%
• Flexible Electronics 100%
• Energy Engineering 33%
• Illustrates 33%
• Multi-Scale Approach 33%
• Finite Element Simulation 33%
• Anisotropic Behavior 33%
• Layer Structure 33%
• Local Failure 33%
• Oxide Layer 33%
• Based Failure Criterion 33%
• Indium-Tin-Oxide 33%
• Multiscale Modeling 33%
• Straightening 33%
• Dielectric Layer 33%
• Compressive Strain 33%
• Critical Location 33%
• Pixel Level 33%
• Film Multi 33%
• Aromatic Polyester 33%
• Show Effect 33%
• Point Bending 33%
• Cohesive Failure 33%
• Buckling 33%
• Thin Films 33%
• Delamination 33%
• Failure Analysis 33%
• Energy Method 33%
• Tunnel Construction 33%

Material Science

• Thin-Film Transistor 100%
• Dielectric Material 33%
• Finite Element Methods 33%
• Silicon Dioxide 33%
• Polyester 33%
• Interface Property 33%
• Indium Tin Oxide 33%
• Multi-Scale Modeling 33%
• Thin Films 33%
• Delamination 33%
• Laminate 33%