Extraction and modelling of self-heating and mutual thermal coupling impedance of bipolar transistors

N. Nenadovic; S. Mijalkovic; L.K. Nanver; L.K.J. Vandamme; V. Alessandro, d'; H. Schellevis; J.W. Slotboom

doi:10.1109/JSSC.2004.833766

Extraction and modelling of self-heating and mutual thermal coupling impedance of bipolar transistors

N. Nenadovic, S. Mijalkovic, L.K. Nanver, L.K.J. Vandamme, V. Alessandro, d', H. Schellevis, J.W. Slotboom

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A measurement system comprised of an ultra-low-distortion function generator, lock-in amplifier, and semiconductor parameter analyzer is used for sensitive extraction of the small-signal thermal impedance network of bipolar devices and circuits. The extraction procedure is demonstrated through measurements on several silicon-on-glass NPN test structures. Behavioral modeling of the mutual thermal coupling obtained by fitting a multipole rational complex function to measured data is presented.

Originele taal-2	Engels
Pagina's (van-tot)	1764-1772
Aantal pagina's	9
Tijdschrift	IEEE Journal of Solid-State Circuits
Volume	39
Nummer van het tijdschrift	10
DOI's	https://doi.org/10.1109/JSSC.2004.833766
Status	Gepubliceerd - 2004

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10.1109/JSSC.2004.833766

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abstract = "A measurement system comprised of an ultra-low-distortion function generator, lock-in amplifier, and semiconductor parameter analyzer is used for sensitive extraction of the small-signal thermal impedance network of bipolar devices and circuits. The extraction procedure is demonstrated through measurements on several silicon-on-glass NPN test structures. Behavioral modeling of the mutual thermal coupling obtained by fitting a multipole rational complex function to measured data is presented.",

author = "N. Nenadovic and S. Mijalkovic and L.K. Nanver and L.K.J. Vandamme and {Alessandro, d'}, V. and H. Schellevis and J.W. Slotboom",

year = "2004",

doi = "10.1109/JSSC.2004.833766",

language = "English",

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T1 - Extraction and modelling of self-heating and mutual thermal coupling impedance of bipolar transistors

AU - Nenadovic, N.

AU - Mijalkovic, S.

AU - Nanver, L.K.

AU - Vandamme, L.K.J.

AU - Alessandro, d', V.

AU - Schellevis, H.

AU - Slotboom, J.W.

PY - 2004

Y1 - 2004

N2 - A measurement system comprised of an ultra-low-distortion function generator, lock-in amplifier, and semiconductor parameter analyzer is used for sensitive extraction of the small-signal thermal impedance network of bipolar devices and circuits. The extraction procedure is demonstrated through measurements on several silicon-on-glass NPN test structures. Behavioral modeling of the mutual thermal coupling obtained by fitting a multipole rational complex function to measured data is presented.

AB - A measurement system comprised of an ultra-low-distortion function generator, lock-in amplifier, and semiconductor parameter analyzer is used for sensitive extraction of the small-signal thermal impedance network of bipolar devices and circuits. The extraction procedure is demonstrated through measurements on several silicon-on-glass NPN test structures. Behavioral modeling of the mutual thermal coupling obtained by fitting a multipole rational complex function to measured data is presented.

U2 - 10.1109/JSSC.2004.833766

DO - 10.1109/JSSC.2004.833766

M3 - Article

SN - 0018-9200

VL - 39

SP - 1764

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JO - IEEE Journal of Solid-State Circuits

JF - IEEE Journal of Solid-State Circuits

IS - 10

ER -

Extraction and modelling of self-heating and mutual thermal coupling impedance of bipolar transistors

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