Experimental studies of the arc chamber short circuit failure mechanism on the DIII-D neutral beam system

B.J. Crowley (Corresponding author), J.P. Beckers, M. Velasco Enriquez, R. Jaspers, J.M. Rauch, J.T. Scoville, A. Sobota, Tijs A. Wijkamp

Onderzoeksoutput: Bijdrage aan tijdschriftTijdschriftartikelAcademicpeer review

Samenvatting

Here we report on efforts to improve performance and longevity of the Neutral Beam Injection (NBI) system by initiating a R&D program aimed at studying the most common failure mechanism for the ion sources. To this end a filament driven plasma chamber has been constructed with plasma parameters similar to the arc chamber of NBI ion sources. A preliminary report of an investigation into the most common failure is presented here: The failure mechanism observed during helium operations on DIII-D is the result of electrical breakdown of the insulation material that separates the filament plates from the anode. The fault is reproduced in a table top experiment analogous to the DIII-D NBI ion source in key parameters and proposals for amelioration of the issue are discussed.

Originele taal-2Engels
Pagina's (van-tot)1605-1609
Aantal pagina's5
TijdschriftFusion Engineering and Design
Volume146
Vroegere onlinedatum5 apr 2019
DOI's
StatusGepubliceerd - sep 2019

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