Experimental characterization of interfe delamination in microsystems

N.V.V.R. Murthy Kolluri, M.H.L. Thissen, J.P.M. Hoefnagels, J.A.W. Dommelen, van, M.G.D. Geers

Onderzoeksoutput: Bijdrage aan congresPoster

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Originele taal-2Engels
StatusGepubliceerd - 2007
EvenementMate Poster Award 2007 : 12th Annual Poster Contest -
Duur: 1 jan 2007 → …

Congres

CongresMate Poster Award 2007 : 12th Annual Poster Contest
Periode1/01/07 → …
AnderMate Poster Award 2007 : 12th Annual Poster Contest

Citeer dit

Murthy Kolluri, N. V. V. R., Thissen, M. H. L., Hoefnagels, J. P. M., Dommelen, van, J. A. W., & Geers, M. G. D. (2007). Experimental characterization of interfe delamination in microsystems. Postersessie gepresenteerd op Mate Poster Award 2007 : 12th Annual Poster Contest, .