EXIT chart analysis of Bayesian MMSE turbo receiver for coded MIMO systems

S. Sun, Yan Wu, Yuan Li, T.T. Tjhung

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/CongresprocedureConferentiebijdrageAcademicpeer review

Originele taal-2Engels
Titel62nd Vehicular Technology Conference (VTC 2005-Fall)
Plaats van productiePiscataway
UitgeverijInstitute of Electrical and Electronics Engineers
Pagina's2377-2381
Volume4
ISBN van geprinte versie0-7803-9152-7
DOI's
StatusGepubliceerd - 2005
Extern gepubliceerdJa
Evenement62nd Vehicular Technology Conference (VTC 2005-Fall) - Dallas, TX, Verenigde Staten van Amerika
Duur: 25 sep 200528 sep 2005
Congresnummer: 62

Congres

Congres62nd Vehicular Technology Conference (VTC 2005-Fall)
Verkorte titelVTC 2005-Fall
LandVerenigde Staten van Amerika
StadDallas, TX
Periode25/09/0528/09/05
Ander2005 IEEE 62nd Vehicular Technology Conference, 2005

Citeer dit

Sun, S., Wu, Y., Li, Y., & Tjhung, T. T. (2005). EXIT chart analysis of Bayesian MMSE turbo receiver for coded MIMO systems. In 62nd Vehicular Technology Conference (VTC 2005-Fall) (Vol. 4, blz. 2377-2381). Piscataway: Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/VETECF.2005.1558974