| Originele taal-2 | Engels |
|---|---|
| Titel | Diagnostic techniques for semiconductor materials processing II : symposium held November 27-30, 1995, Boston, Massachusetts, U.S.A |
| Redacteuren | S.W. Pang |
| Pagina's | 283-288 |
| Status | Gepubliceerd - 1996 |
| Evenement | Diagnostic Techniques for Semiconductor Materials Processing II, November 27-30, 1995, Boston, MA, USA - Boston, MA, Verenigde Staten van Amerika Duur: 27 nov 1995 → 30 nov 1995 |
Publicatie series
| Naam | Materials Research Society Symposium Proceedings |
|---|---|
| Volume | 406 |
| ISSN van geprinte versie | 0272-9172 |
Congres
| Congres | Diagnostic Techniques for Semiconductor Materials Processing II, November 27-30, 1995, Boston, MA, USA |
|---|---|
| Land | Verenigde Staten van Amerika |
| Stad | Boston, MA |
| Periode | 27/11/95 → 30/11/95 |
| Ander | MRS Fall Meeting ; 1995 (Boston, Mass.) : 1995.11.27-30 |
Citeer dit
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Exciton Dynamics in Ultrathin InAs/GaAs Quantum-Wells. / Brübach, J.; Haverkort, J.E.M.; Wolter, J.H.; Wang, P.D.; Ledentsov, N.N.; Sotomayor Torres, C.M.
Diagnostic techniques for semiconductor materials processing II : symposium held November 27-30, 1995, Boston, Massachusetts, U.S.A. redactie / S.W. Pang. 1996. blz. 283-288 (Materials Research Society Symposium Proceedings; Vol. 406).Onderzoeksoutput: Hoofdstuk in Boek/Rapport/Congresprocedure › Conferentiebijdrage › Academic › peer review
TY - GEN
T1 - Exciton Dynamics in Ultrathin InAs/GaAs Quantum-Wells
AU - Brübach, J.
AU - Haverkort, J.E.M.
AU - Wolter, J.H.
AU - Wang, P.D.
AU - Ledentsov, N.N.
AU - Sotomayor Torres, C.M.
PY - 1996
Y1 - 1996
M3 - Conference contribution
SN - 1-558-99309-6
T3 - Materials Research Society Symposium Proceedings
SP - 283
EP - 288
BT - Diagnostic techniques for semiconductor materials processing II : symposium held November 27-30, 1995, Boston, Massachusetts, U.S.A
A2 - Pang, S.W.
ER -