Exchange biasing in MBE-grown Fe3O4/CoO bilayers; the antiferromagnetic layer thickness dependence

P.J. Zaag, van der, A.R. Ball, L.F. Feiner, R.M. Wolf, P.A.A. Heijden, van der

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127 Citaten (Scopus)

Samenvatting

Exchange biasing has been studied for a series of [100] and [111] oriented, epitaxial Fe3O4/CoO bilayers grown by oxidic MBE. The low‐temperature exchange biasing versus CoO layer thickness is compared to theoretical models for exchange biasing. We argue that the Malozemoff random field model does not apply to this system. The exchange biasing calculated according to the Meiklejohn–Bean model, assuming nearest‐neighbor exchange coupling across a flat and magnetically uncompensated interface, differs for [100] oriented bilayers by a factor of ≂8 from the experimental value.
Originele taal-2Engels
TitelMMM Conference, Philadelphia, USA
Pagina's5103-5105
Aantal pagina's3
DOI's
StatusGepubliceerd - 1996
Evenement40th Annual Conference on Magnetism and Magnetic Materials (MMM 1996) - Philadelphia, Verenigde Staten van Amerika
Duur: 6 nov 19969 nov 1996
Congresnummer: 40

Publicatie series

NaamJournal of Applied Physics
Volume79
ISSN van geprinte versie0021-8979

Congres

Congres40th Annual Conference on Magnetism and Magnetic Materials (MMM 1996)
Verkorte titelMMM 1996
LandVerenigde Staten van Amerika
StadPhiladelphia
Periode6/11/969/11/96
AnderMMM Conference

Citeer dit

Zaag, van der, P. J., Ball, A. R., Feiner, L. F., Wolf, R. M., & Heijden, van der, P. A. A. (1996). Exchange biasing in MBE-grown Fe3O4/CoO bilayers; the antiferromagnetic layer thickness dependence. In MMM Conference, Philadelphia, USA (blz. 5103-5105). (Journal of Applied Physics; Vol. 79). https://doi.org/10.1063/1.361315