Evaluation of scaled and annular pupils within the framework of the Extended Nijboer-Zernike (ENZ) formalism

Sven van Haver; A.J.E.M. Janssen; Joseph J.M. Braat; Silvania F. Pereira

Evaluation of scaled and annular pupils within the framework of the Extended Nijboer-Zernike (ENZ) formalism

Sven van Haver, A.J.E.M. Janssen, Joseph J.M. Braat, Silvania F. Pereira

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/Congresprocedure › Conferentiebijdrage › Academic › peer review

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We present concise formulae for the Zernike coefficients of numerical aperture reduced pupils and show how they can be exploited within the framework of the ENZ-formalism to characterize optical systems with scaled and annular pupils.

Originele taal-2	Engels
Titel	Optical fabrication and testing, 21-24 October 2008, Rochester, New York, United States
Plaats van productie	Washington, D.C.
Uitgeverij	Optical Society of America (OSA)
Aantal pagina's	1
ISBN van geprinte versie	9781557528612
Status	Gepubliceerd - 1 jan. 2008
Extern gepubliceerd	Ja
Evenement	Frontiers in Optics, FiO 2008 - Rochester, Verenigde Staten van Amerika Duur: 19 okt. 2008 → 23 okt. 2008

Congres

Congres	Frontiers in Optics, FiO 2008
Land/Regio	Verenigde Staten van Amerika
Stad	Rochester
Periode	19/10/08 → 23/10/08

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@inproceedings{a1723685127949058448db5cfb60956e,

title = "Evaluation of scaled and annular pupils within the framework of the Extended Nijboer-Zernike (ENZ) formalism",

abstract = "We present concise formulae for the Zernike coefficients of numerical aperture reduced pupils and show how they can be exploited within the framework of the ENZ-formalism to characterize optical systems with scaled and annular pupils.",

author = "{van Haver}, Sven and A.J.E.M. Janssen and Braat, {Joseph J.M.} and Pereira, {Silvania F.}",

year = "2008",

month = jan,

day = "1",

language = "English",

isbn = "9781557528612",

booktitle = "Optical fabrication and testing, 21-24 October 2008, Rochester, New York, United States",

publisher = "Optical Society of America (OSA)",

address = "United States",

note = "Frontiers in Optics, FiO 2008 ; Conference date: 19-10-2008 Through 23-10-2008",

}

van Haver, S, Janssen, AJEM, Braat, JJM & Pereira, SF 2008, Evaluation of scaled and annular pupils within the framework of the Extended Nijboer-Zernike (ENZ) formalism. in Optical fabrication and testing, 21-24 October 2008, Rochester, New York, United States., JWA.25, Optical Society of America (OSA), Washington, D.C., Frontiers in Optics, FiO 2008, Rochester, New York, Verenigde Staten van Amerika, 19/10/08.

Evaluation of scaled and annular pupils within the framework of the Extended Nijboer-Zernike (ENZ) formalism. / van Haver, Sven; Janssen, A.J.E.M.; Braat, Joseph J.M. et al.
Optical fabrication and testing, 21-24 October 2008, Rochester, New York, United States. Washington, D.C.: Optical Society of America (OSA), 2008. JWA.25.

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/Congresprocedure › Conferentiebijdrage › Academic › peer review

TY - GEN

T1 - Evaluation of scaled and annular pupils within the framework of the Extended Nijboer-Zernike (ENZ) formalism

AU - van Haver, Sven

AU - Janssen, A.J.E.M.

AU - Braat, Joseph J.M.

AU - Pereira, Silvania F.

PY - 2008/1/1

Y1 - 2008/1/1

N2 - We present concise formulae for the Zernike coefficients of numerical aperture reduced pupils and show how they can be exploited within the framework of the ENZ-formalism to characterize optical systems with scaled and annular pupils.

AB - We present concise formulae for the Zernike coefficients of numerical aperture reduced pupils and show how they can be exploited within the framework of the ENZ-formalism to characterize optical systems with scaled and annular pupils.

UR - http://www.scopus.com/inward/record.url?scp=84898638286&partnerID=8YFLogxK

M3 - Conference contribution

SN - 9781557528612

BT - Optical fabrication and testing, 21-24 October 2008, Rochester, New York, United States

PB - Optical Society of America (OSA)

CY - Washington, D.C.

T2 - Frontiers in Optics, FiO 2008

Y2 - 19 October 2008 through 23 October 2008

ER -

Evaluation of scaled and annular pupils within the framework of the Extended Nijboer-Zernike (ENZ) formalism

Samenvatting

Congres

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