Empirical and theoretical characterization of electrostatically driven MEMS structures with stress gradients

J. De Coster, H.A.C. Tilmans, J.M.J. Toonder, den, J.T.M. van Beek, T.G.S.M. Rijks, P.G. Steeneken, R. Puers

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16 Citaten (Scopus)
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Samenvatting

This paper investigates the influence of residual stress on the characteristics of electrostatic actuators. This is first done empirically by mechanical characterisation of a set of RF-MEMS switches with varying geometries. The mechanical measurements are performed on a Dektak surface profilometer. In addition, low-frequency electrical characterisation is performed. The measurement results allow for fine-tuning of the analytical relationship between pull-in voltage and geometrical parameters. This generally applicable method therefore reduces the need for more advanced but time-consuming electromechanical simulations to predict the electrostatic switching behaviour of a large range of (RF-)MEMS devices with various geometries. Next, an analytical formula is derived, relating the deformation of the actuator due to stress and stress gradients to the electrostatic pull-in voltage. The results obtained with this formula are in good agreement with the measurements.
Originele taal-2Engels
Pagina's (van-tot)555-562
TijdschriftSensors and Actuators, A: Physical
Volume123-124
DOI's
StatusGepubliceerd - 2005

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