Embedded multi-detect ATPG and its effect on the detection of unmodeled defects

J. Geuzebroek; E.J. Marinissen; A. Majhi; A. Glowatz; F. Hapke

doi:10.1109/TEST.2007.4437649

Embedded multi-detect ATPG and its effect on the detection of unmodeled defects

J. Geuzebroek
, E.J. Marinissen
, A. Majhi
, A. Glowatz
, F. Hapke

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/Congresprocedure › Hoofdstuk › Academic › peer review

61 Citaten (Scopus)

Samenvatting

The demand for higher quality requires more effective testing to filter out the bad devices. It is already known that multi-detection of single stuck-at faults results in more fortuitous detections of defects not behaving as stuck-at faults, which increases the test quality. Existing multi-detect tests, i.e., the well-known n-detect tests, suffer from significant test size increases. This paper shows that embedding multi-detection of faults within regular ATPG patterns results in a higher quality without a significant increase in test set size. High-volume silicon measurement results demonstrate that embedded multi-detect tests detect 2.3% to 4.7% more defective devices than conventional single-detect stuck-at tests.

Originele taal-2	Engels
Titel	2007 IEEE International Test Conference
Plaats van productie	Piscataway
Uitgeverij	Institute of Electrical and Electronics Engineers
Aantal pagina's	10
ISBN van geprinte versie	978-1-4244-1127-6
DOI's	https://doi.org/10.1109/TEST.2007.4437649
Status	Gepubliceerd - 2007
Extern gepubliceerd	Ja
Evenement	10th Design, Automation and Test in Europe Conference and Exhibition (DATE 2007) - Acropolis, Nice, Frankrijk Duur: 16 apr. 2007 → 20 apr. 2007 Congresnummer: 10

Congres

Congres	10th Design, Automation and Test in Europe Conference and Exhibition (DATE 2007)
Verkorte titel	DATE 2007
Land/Regio	Frankrijk
Stad	Nice
Periode	16/04/07 → 20/04/07
Ander	DATE 2007

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Geuzebroek, J, Marinissen, EJ, Majhi, A, Glowatz, A & Hapke, F 2007, Embedded multi-detect ATPG and its effect on the detection of unmodeled defects. in 2007 IEEE International Test Conference., 30.3, Institute of Electrical and Electronics Engineers, Piscataway, 10th Design, Automation and Test in Europe Conference and Exhibition (DATE 2007), Nice, Frankrijk, 16/04/07. https://doi.org/10.1109/TEST.2007.4437649

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Embedded multi-detect ATPG and its effect on the detection of unmodeled defects

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Congres

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