Embedded multi-detect ATPG and its effect on the detection of unmodeled defects

J. Geuzebroek, E.J. Marinissen, A. Majhi, A. Glowatz, F. Hapke

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/CongresprocedureHoofdstukAcademicpeer review

60 Citaten (Scopus)

Samenvatting

The demand for higher quality requires more effective testing to filter out the bad devices. It is already known that multi-detection of single stuck-at faults results in more fortuitous detections of defects not behaving as stuck-at faults, which increases the test quality. Existing multi-detect tests, i.e., the well-known n-detect tests, suffer from significant test size increases. This paper shows that embedding multi-detection of faults within regular ATPG patterns results in a higher quality without a significant increase in test set size. High-volume silicon measurement results demonstrate that embedded multi-detect tests detect 2.3% to 4.7% more defective devices than conventional single-detect stuck-at tests.
Originele taal-2Engels
Titel2007 IEEE International Test Conference
Plaats van productiePiscataway
UitgeverijInstitute of Electrical and Electronics Engineers
Aantal pagina's10
ISBN van geprinte versie978-1-4244-1127-6
DOI's
StatusGepubliceerd - 2007
Extern gepubliceerdJa
Evenement10th Design, Automation and Test in Europe Conference and Exhibition (DATE 2007) - Acropolis, Nice, Frankrijk
Duur: 16 apr. 200720 apr. 2007
Congresnummer: 10

Congres

Congres10th Design, Automation and Test in Europe Conference and Exhibition (DATE 2007)
Verkorte titelDATE 2007
Land/RegioFrankrijk
StadNice
Periode16/04/0720/04/07
AnderDATE 2007

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