Electronic THz-spectrometer for plasmonic enhanced deep subwavelength layer detection

A. Berrier, M.C. Schaafsma, J. Gómez Rivas, H. Schäfer-Eberwein, P. Haring Bolivar, L. Tripodi, M.K. Matters-Kammerer

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/CongresprocedureConferentiebijdrageAcademicpeer review

2 Citaten (Scopus)
6 Downloads (Pure)

Samenvatting

We demonstrate the operation of a miniaturized all-electronic CMOS based THz spectrometer with performances comparable to that of a THz-TDS spectrometer in the frequency range 20 to 220 GHz. The use of this all-electronic THz spectrometer for detection of a thin TiO2 layer and a B. subtilis bacteria film on top of a plasmonic surface is evaluated. The detection of deeply subwavelength layers with comparable performance as a femtosecond laser based THz-TDS spectrometer is demonstrated. The size of the all-electronic spectrometer is 5 cm by 1cm. The high degree of integration of this spectrometer in combination with plasmonics enhanced sensitivity opens the way to bring THz spectroscopy to consumer applications or to the practitioner's office.

Originele taal-2Engels
TitelEuropean Microwave Week 2015: "Freedom Through Microwaves", EuMW 2015 - Conference Proceedings; 2015 45th European Microwave Conference Proceedings, EuMC
Plaats van productiePiscataway
UitgeverijInstitute of Electrical and Electronics Engineers
Pagina's925-928
Aantal pagina's4
ISBN van geprinte versie978-2-87487-039-2
DOI's
StatusGepubliceerd - 2 dec 2015
Evenement45th European Microwave Conference (EuMC 2015) - Paris, Frankrijk
Duur: 7 sep 201510 sep 2015
Congresnummer: 45

Congres

Congres45th European Microwave Conference (EuMC 2015)
Verkorte titelEuMC 2015
LandFrankrijk
StadParis
Periode7/09/1510/09/15
AnderEuropean Microwave Conference (EUMC)

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