Electron source concept for single-shot sub-100 fs electron diffraction in the 100 keV range

T. Oudheusden, van, E.F. Jong, de, S.B. Geer, van der, W.P.E.M. Root, op 't, O.J. Luiten, B.J. Siwick

Onderzoeksoutput: Bijdrage aan tijdschriftTijdschriftartikelAcademicpeer review

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Samenvatting

We present a method for producing sub-100 fs electron bunches that are suitable for single-shot ultrafast electron diffraction experiments in the 100 keV energy range. A combination of analytical estimates and state-of-the-art particle tracking simulations show that it is possible to create 100 keV, 0.1 pC, 30 fs electron bunches with a spot size smaller than 500 ?m and a transverse coherence length of 3 nm, using established technologies in a table-top setup. The system operates in the space-charge dominated regime to produce energy-correlated bunches that are recompressed by radio-frequency techniques. With this approach we overcome the Coulomb expansion of the bunch, providing a single-shot, ultrafast electron diffraction source concept.
Originele taal-2Engels
Artikelnummer093501
Pagina's (van-tot)093501-1/8
Aantal pagina's8
TijdschriftJournal of Applied Physics
Volume102
Nummer van het tijdschrift9
DOI's
StatusGepubliceerd - 2007

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