Electrical method for on-wafer modal gain characterization of semiconductor optical amplifiers

E. Bitincka, R.G. Broeke, M.K. Smit

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/CongresprocedureConferentiebijdrageAcademicpeer review

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Originele taal-2Engels
TitelProceedings of the 17th European Conference on Integrated Optics and Technical Exhibitionan, 19th Microoptics Conference(ECIO-MOC), 24-27 June 2014, Nice, France
Pagina'sWe 3a R3-1/2
StatusGepubliceerd - 2014

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