Samenvatting
This paper presents a number of novel methods to measure the junction temperature and to estimate the health of gallium nitride light-emitting diodes (LEDs). The methods are based on measurements of the dynamic impedance and optical output. Our experimental analysis reveals temperature sensitive parameters of the electrical and optical responses. Moreover, a correlation between the non-radiative current characterizing the active region defects and the small-signal impedance is shown. The demonstrated methods can be applied to enhance existing temperature-monitoring techniques. The derived dependencies also build a foundation for advanced in-field health monitoring of the LEDs using the infrastructure of visible light communication systems. Such methods and techniques are valuable for predictive maintenance of solid state lighting systems.
| Originele taal-2 | Engels |
|---|---|
| Artikelnummer | 107599 |
| Aantal pagina's | 8 |
| Tijdschrift | Measurement: Journal of the International Measurement Confederation |
| Volume | 156 |
| DOI's | |
| Status | Gepubliceerd - mei 2020 |
Financiering
The contribution of European Union is acknowledged for supporting the study in the context of the ECSEL Joint Undertaking program #692465 (2016?2019). Additional information available on: www.DELPHI4LED.eu.
| Financiers | Financiernummer |
|---|---|
| European Union’s Horizon Europe research and innovation programme | 692465 |
| European Commission | |
| Electronic Components and Systems for European Leadership |