Dynamic probe calibration up to 10 kHz using laser interferometry

H. Haitjema; G.J.W.L. Kotte

doi:10.1016/S0263-2241(97)00052-3

Dynamic probe calibration up to 10 kHz using laser interferometry

H. Haitjema, G.J.W.L. Kotte

Mechanical Engineering

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This paper describes two systems for dynamic probe calibrations which are in use at the Van Swinden Laboratory of the Netherlands Measurements Institute (NMi-VSL). The systems have in common that they enable both static and dynamic probe calibration using a laser interferometer. The displacements are generated using piezoelectric devices. Measurements are shown which illustrate the capabilities of the systems to characterize and calibrate fast-moving probes.

Originele taal-2	Engels
Pagina's (van-tot)	107-111
Tijdschrift	Measurement: Journal of the International Measurement Confederation
Volume	21
Nummer van het tijdschrift	3
DOI's	https://doi.org/10.1016/S0263-2241(97)00052-3
Status	Gepubliceerd - 1997

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10.1016/S0263-2241(97)00052-3

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Dynamic probe calibration up to 10 kHz using laser interferometry

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