Dual-channel 56 Gb/s PAM-4 electro-absorption modulator driver for 3D wafer scale packaging

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Samenvatting

This paper presents the design and measurement of a 2 × 56 Gb/s PAM-4 dual-channel electro-absorption modulator (EAM) driver in a 0.25-μm SiGe:C BiCMOS process for 3D wafer scale packaging. In this paper, a new EAM coupling method for 3D wafer scale packing is presented. The driver employs an optimized output interface with the EAM, which increases the output voltage swing by 53% while keep the same bandwidth and power consumption. The driver has 13.7 dB of gain with a 3 dB bandwidth of 31.5 GHz, which delivers 3 V ppd at 56 Gb/s PAM-4 and consumes 364.5 mW per channel, resulting in a figure of merit of 6.5 pJ/bit.

Originele taal-2Engels
Titel2018 Asia-Pacific Microwave Conference, APMC 2018
Plaats van productiePiscataway
UitgeverijInstitute of Electrical and Electronics Engineers
Pagina's237-239
Aantal pagina's3
ISBN van elektronische versie978-4-9023-3945-1
DOI's
StatusGepubliceerd - 16 jan. 2019
Evenement2018 Asia-Pacific Microwave Conference, APMC 2018 - Kyoto, Japan
Duur: 6 nov. 20189 nov. 2018
Congresnummer: 30

Congres

Congres2018 Asia-Pacific Microwave Conference, APMC 2018
Land/RegioJapan
StadKyoto
Periode6/11/189/11/18

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