Samenvatting
This paper presents the design and measurement of a 2 × 56 Gb/s PAM-4 dual-channel electro-absorption modulator (EAM) driver in a 0.25-μm SiGe:C BiCMOS process for 3D wafer scale packaging. In this paper, a new EAM coupling method for 3D wafer scale packing is presented. The driver employs an optimized output interface with the EAM, which increases the output voltage swing by 53% while keep the same bandwidth and power consumption. The driver has 13.7 dB of gain with a 3 dB bandwidth of 31.5 GHz, which delivers 3 V ppd at 56 Gb/s PAM-4 and consumes 364.5 mW per channel, resulting in a figure of merit of 6.5 pJ/bit.
Originele taal-2 | Engels |
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Titel | 2018 Asia-Pacific Microwave Conference, APMC 2018 |
Plaats van productie | Piscataway |
Uitgeverij | Institute of Electrical and Electronics Engineers |
Pagina's | 237-239 |
Aantal pagina's | 3 |
ISBN van elektronische versie | 978-4-9023-3945-1 |
DOI's | |
Status | Gepubliceerd - 16 jan. 2019 |
Evenement | 2018 Asia-Pacific Microwave Conference, APMC 2018 - Kyoto, Japan Duur: 6 nov. 2018 → 9 nov. 2018 Congresnummer: 30 |
Congres
Congres | 2018 Asia-Pacific Microwave Conference, APMC 2018 |
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Land/Regio | Japan |
Stad | Kyoto |
Periode | 6/11/18 → 9/11/18 |