Discovering hidden material properties of MgCl2 at atomic resolution with structured temporal electron illumination of picosecond time resolution

Christian Kisielowski (Corresponding author), Petra Specht, Bert Freitag, Erik R. Kieft, Wouter Verhoeven, Jasper F.M. van Rens, Peter Mutsaers, Jom Luiten, Steve Rozeveld, Joo Kang, Alyssa J. McKenna, Peter Nickias, David F. Yancey (Corresponding author)

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Uittreksel

A combination of atomic resolution phase contrast electron microscopy and pulsed electron beams reveals pristine properties of MgCl2 at 1.7 Å resolution that were previously masked by air and beam damage. Both the inter- and intra-layer bonding in pristine MgCl2 are weak, which leads to uncommonly large local orientation variations that characterize this Ziegler–Natta catalyst support. By delivering electrons with 1–10 ps pulses and ≈160 ps delay times, phonons induced by the electron irradiation in the material are allowed to dissipate before the subsequent delivery of the next electron packet, thus mitigating phonon accumulations. As a result, the total electron dose can be extended by a factor of 80–100 to study genuine material properties at atomic resolution without causing object alterations, which is more effective than reducing the sample temperature. In conditions of minimal damage, beam currents approach femtoamperes with dose rates around 1 eÅ−2 s−1. Generally, the utilization of pulsed electron beams is introduced herein to access genuine material properties while minimizing beam damage.

TaalEngels
Artikelnummer1807818
Aantal pagina's7
TijdschriftAdvanced Functional Materials
Volume29
Nummer van het tijdschrift11
DOI's
StatusGepubliceerd - 14 mrt 2019

Vingerafdruk

Materials properties
Lighting
illumination
damage
Electrons
Electron beams
Ziegler catalyst
electron beams
dosage
electrons
Electron irradiation
phase contrast
electron irradiation
Phonons
beam currents
Catalyst supports
Electron microscopy
Time delay
delivery
electron microscopy

Trefwoorden

    Citeer dit

    Kisielowski, Christian ; Specht, Petra ; Freitag, Bert ; Kieft, Erik R. ; Verhoeven, Wouter ; van Rens, Jasper F.M. ; Mutsaers, Peter ; Luiten, Jom ; Rozeveld, Steve ; Kang, Joo ; McKenna, Alyssa J. ; Nickias, Peter ; Yancey, David F./ Discovering hidden material properties of MgCl2 at atomic resolution with structured temporal electron illumination of picosecond time resolution. In: Advanced Functional Materials. 2019 ; Vol. 29, Nr. 11.
    @article{a71a47af4d3a49a58a0253e931cab580,
    title = "Discovering hidden material properties of MgCl2 at atomic resolution with structured temporal electron illumination of picosecond time resolution",
    abstract = "A combination of atomic resolution phase contrast electron microscopy and pulsed electron beams reveals pristine properties of MgCl2 at 1.7 {\AA} resolution that were previously masked by air and beam damage. Both the inter- and intra-layer bonding in pristine MgCl2 are weak, which leads to uncommonly large local orientation variations that characterize this Ziegler–Natta catalyst support. By delivering electrons with 1–10 ps pulses and ≈160 ps delay times, phonons induced by the electron irradiation in the material are allowed to dissipate before the subsequent delivery of the next electron packet, thus mitigating phonon accumulations. As a result, the total electron dose can be extended by a factor of 80–100 to study genuine material properties at atomic resolution without causing object alterations, which is more effective than reducing the sample temperature. In conditions of minimal damage, beam currents approach femtoamperes with dose rates around 1 e{\AA}−2 s−1. Generally, the utilization of pulsed electron beams is introduced herein to access genuine material properties while minimizing beam damage.",
    keywords = "characterization tools, holography, MgCl nanocrystals, ultrafast electron microscopy, Ziegler–Natta catalysts",
    author = "Christian Kisielowski and Petra Specht and Bert Freitag and Kieft, {Erik R.} and Wouter Verhoeven and {van Rens}, {Jasper F.M.} and Peter Mutsaers and Jom Luiten and Steve Rozeveld and Joo Kang and McKenna, {Alyssa J.} and Peter Nickias and Yancey, {David F.}",
    year = "2019",
    month = "3",
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    doi = "10.1002/adfm.201807818",
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    Discovering hidden material properties of MgCl2 at atomic resolution with structured temporal electron illumination of picosecond time resolution. / Kisielowski, Christian (Corresponding author); Specht, Petra; Freitag, Bert; Kieft, Erik R.; Verhoeven, Wouter; van Rens, Jasper F.M.; Mutsaers, Peter; Luiten, Jom; Rozeveld, Steve; Kang, Joo; McKenna, Alyssa J.; Nickias, Peter; Yancey, David F. (Corresponding author).

    In: Advanced Functional Materials, Vol. 29, Nr. 11, 1807818, 14.03.2019.

    Onderzoeksoutput: Bijdrage aan tijdschriftTijdschriftartikelAcademicpeer review

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    AU - Verhoeven,Wouter

    AU - van Rens,Jasper F.M.

    AU - Mutsaers,Peter

    AU - Luiten,Jom

    AU - Rozeveld,Steve

    AU - Kang,Joo

    AU - McKenna,Alyssa J.

    AU - Nickias,Peter

    AU - Yancey,David F.

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    AB - A combination of atomic resolution phase contrast electron microscopy and pulsed electron beams reveals pristine properties of MgCl2 at 1.7 Å resolution that were previously masked by air and beam damage. Both the inter- and intra-layer bonding in pristine MgCl2 are weak, which leads to uncommonly large local orientation variations that characterize this Ziegler–Natta catalyst support. By delivering electrons with 1–10 ps pulses and ≈160 ps delay times, phonons induced by the electron irradiation in the material are allowed to dissipate before the subsequent delivery of the next electron packet, thus mitigating phonon accumulations. As a result, the total electron dose can be extended by a factor of 80–100 to study genuine material properties at atomic resolution without causing object alterations, which is more effective than reducing the sample temperature. In conditions of minimal damage, beam currents approach femtoamperes with dose rates around 1 eÅ−2 s−1. Generally, the utilization of pulsed electron beams is introduced herein to access genuine material properties while minimizing beam damage.

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