@inproceedings{40bc9cd6ad8f45f8968d379ae269788d,
title = "Direct composition profiling in III-V nanostructures by cross-sectional STM",
abstract = "Using cross-sectional STM we have studied the local composition in III–V nanostructures such as GaAs/InGaAs quantum wells, InGaNAs/InP quantum wells and quantum dots, and InAs/GaAs self-assembled quantum dots. We are able to determine the local composition by either simply counting the constituent atoms, measuring the local lattice constant or measuring the relaxation of the cleaved surface due to the elastic field of the buried strained nanostructures.",
author = "D.M. Bruls and P.M. Koenraad and J.H. Davies and S.P.A. Gill and Fei Long and M. Hopkinson and M.S. Skolnick and J.H. Wolter and J.T. Devreese",
year = "2003",
language = "English",
isbn = "0-7503-0924-5",
series = "Institute of Physics Conference Series",
publisher = "Institue of Physics Publishing Ltd",
pages = "77--84",
booktitle = "Proceedings of the 26th International Conference on the Physics of Semiconductors, 29 July -2 August 2002, Edinburgh, United Kingdom",
note = "26th International Conference on the Physics of Semiconductors ; Conference date: 29-07-2002 Through 02-08-2002",
}