Digital twins in mechatronics: From model-based control to predictive maintenance

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/CongresprocedureConferentiebijdrageAcademicpeer review

23 Citaten (Scopus)

Samenvatting

Fault diagnosis systems are essential in precision mechatronics to facilitate maintenance and to minimize downtime. The aim of this paper is to describe the current trend in control for precision mechatronics and the related future challenges for digital twin-assisted predictive maintenance as well as recently developed approaches. The future generation of fault diagnosis systems is envisaged to rely on identified physics-based models, enriched by the available real-time data from a large number of sensors and actuators.

Originele taal-2Engels
Titel2021 IEEE 1st International Conference on Digital Twins and Parallel Intelligence (DTPI)
UitgeverijInstitute of Electrical and Electronics Engineers
Pagina's336-339
Aantal pagina's4
ISBN van elektronische versie9781665433372
DOI's
StatusGepubliceerd - 22 sep. 2021
Evenement1st IEEE International Conference on Digital Twins and Parallel Intelligence, DTPI 2021 - Beijing, China
Duur: 15 jul. 202115 aug. 2021
Congresnummer: 1
https://www.dtpi.org/

Congres

Congres1st IEEE International Conference on Digital Twins and Parallel Intelligence, DTPI 2021
Verkorte titelDTPI 2021
Land/RegioChina
StadBeijing
Periode15/07/2115/08/21
Internet adres

Bibliografische nota

Funding Information:
ACKNOWLEDGEMENT This work is supported by Topconsortia voor Kennis en Innovatie (TKI), and is supported by ASML Research, Veld-hoven, The Netherlands.

Publisher Copyright:
© 2021 IEEE.

Financiering

ACKNOWLEDGEMENT This work is supported by Topconsortia voor Kennis en Innovatie (TKI), and is supported by ASML Research, Veld-hoven, The Netherlands.

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