Diagnosing Bridging Faults in Random Logic

S.C. Hora, W. Beverloo, M. Lousberg, M.T.M. Segers

    Onderzoeksoutput: Bijdrage aan congresPaperAcademic

    Originele taal-2Engels
    StatusGepubliceerd - 2000
    Evenementconference; 1st IEEE Int. Workshop on Yield Optimization and Test; 2000-12-05; 2000-12-06 -
    Duur: 5 dec. 20006 dec. 2000

    Congres

    Congresconference; 1st IEEE Int. Workshop on Yield Optimization and Test; 2000-12-05; 2000-12-06
    Periode5/12/006/12/00
    Ander1st IEEE Int. Workshop on Yield Optimization and Test

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