Development of electromagnetic analytical models for substrate noise propagation in integrated circuits

M. Grau Novellas, R. Serra, Matthias Rose

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/CongresprocedureConferentiebijdrageAcademicpeer review

1 Citaat (Scopus)
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Samenvatting

In this paper, electromagnetic analytical models for substrate noise propagation are developed for its use in electromagnetic compatibility performance prediction for integrated circuits. The propagation mechanisms for surface waves caused by injected currents are studied and models covering different substrate technology options are provided. In addition, closed-form expressions for interference prediction are derived in order to provide useful information regarding substrate noise coupling at early stages of the design process.
Originele taal-2Engels
Titelproceedings of the 2015 IEEE international symposium on electromagnetic compatibility (EMC)
UitgeverijInstitute of Electrical and Electronics Engineers
Pagina's582 - 587
DOI's
StatusGepubliceerd - 2015
EvenementIEEE International Symposium on Electromagnetic Compatibility, EMC 2015 - Dresden, Duitsland
Duur: 16 aug 201522 aug 2015
http://conference.vde.com/emc2015/Pages/default.aspx

Congres

CongresIEEE International Symposium on Electromagnetic Compatibility, EMC 2015
Verkorte titelEMC 2015
Land/RegioDuitsland
StadDresden
Periode16/08/1522/08/15
AnderIEEE International Symposium on Electromagnetic Compatibility
Internet adres

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