Determination of the shape and composition of InAs quantum dots at the atomic level by cross-sectional STM

D.M. Bruls, P.M. Koenraad, T. Reusch, M. Kemerink, M. Hopkinson, M.S. Skolnick, F. Long, S.P.A. Gill, J.H. Wolter, H.W.M. Salemink

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/CongresprocedureConferentiebijdrageAcademicpeer review

Originele taal-2Engels
TitelProceedings of the 11th International Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Techniques, 15-20 July 2001, Vancouver, Canada
Pagina's96-
StatusGepubliceerd - 2001
Evenement25th International Conference on the Physics of Semiconductors, September 17-22, 2000, Osaka, Japan - Osaka, Japan
Duur: 17 sep 200022 sep 2000

Congres

Congres25th International Conference on the Physics of Semiconductors, September 17-22, 2000, Osaka, Japan
LandJapan
StadOsaka
Periode17/09/0022/09/00
Ander25th Int. Conf. on the Physics of Semiconductors. Osaka, Japan

Citeer dit