Determination of the crack resistance of thin hard coatings by in situ bending in scanning electron microscope

M.D. Tran, E.C.A. Dekkers, R. Diesen, van, J.H. Dautzenberg

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/Congresprocedure › Hoofdstuk › Academic › peer review

Citeer dit

@inbook{2e32dffa68cb46babfa6d86e04dc7318,

title = "Determination of the crack resistance of thin hard coatings by in situ bending in scanning electron microscope",

author = "M.D. Tran and E.C.A. Dekkers and {Diesen, van}, R. and J.H. Dautzenberg",

year = "1997",

language = "English",

isbn = "3-901888-00-4",

pages = "135--140",

booktitle = "Mikro- und Nanotechnologie",

publisher = "TU",

}