Determination of spin-dependent scattering parameters of NiFe/Cu and Co/Cu multilayers

S.K.J. Lenczowski; M.A.M. Gijs; R.J.M. van de Veerdonk; J.B. Giesbers; W.J.M. de Jonge

doi:10.1557/PROC-384-341

Determination of spin-dependent scattering parameters of NiFe/Cu and Co/Cu multilayers

S.K.J. Lenczowski, M.A.M. Gijs, R.J.M. van de Veerdonk, J.B. Giesbers, W.J.M. de Jonge

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/Congresprocedure › Conferentiebijdrage › Academic › peer review

15 Citaten (Scopus)

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We present magnetoresistance (MR) data of high-vacuum magnetron sputtered NiFe/Cu multilayers (NiFe=NisoFe20) grown on Si(lOO) substrates with a Cu buffer layer and compare these with earlier results on Co/Cu(lOO) multilayers [1]. Measured MR values are directly proportional to the antiferromagnetically coupled fraction in the multilayers. Extrapolating to full antiparallel alignment, we can make a reliable comparison of the MR wrt,h the magnetoresistance model of Levy,
Zhang, and Fert [2,3]. For the NiFe/Cu multilayers the deduced spin-asymmetry parameters are a~iFe/Cu = 5.0 ± 0.4 and a~iFe = 2.1 ± 0.3 for interface and bulk scattering, respectively. Although much smaller than in our Co/Cu multilayers, where afo/Cu = 21 ± 3 and af0 = 2.6 ± 0.3, .it is still the spin dependence of the interface scattering that is the main cause for the large MR values.

Originele taal-2	Engels
Titel	Magnetic ultrathin films, multilayers and surfaces : symposium held April 17-20, 1995, San Francisco, California, U.S.A.
Redacteuren	E.E. Marinero, B. Heinrich, W.F. Egelhoff
Plaats van productie	Pitsburgh
Uitgeverij	Materials Research Society
Pagina's	341-346
Aantal pagina's	6
ISBN van geprinte versie	1-55899-287-1
DOI's	https://doi.org/10.1557/PROC-384-341
Status	Gepubliceerd - 1 dec. 1995
Evenement	1995 MRS Spring Meeting - San Francisco, Verenigde Staten van Amerika Duur: 18 apr. 1995 → 21 apr. 1995 https://www.mrs.org/spring1995

Publicatie series

Naam	Materials Research Society Symposium - Proceedings
Volume	384
ISSN van geprinte versie	0272-9172

Congres

Congres	1995 MRS Spring Meeting
Land/Regio	Verenigde Staten van Amerika
Stad	San Francisco
Periode	18/04/95 → 21/04/95
Internet adres	https://www.mrs.org/spring1995

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Lenczowski, S. K. J., Gijs, M. A. M., van de Veerdonk, R. J. M., Giesbers, J. B., & de Jonge, W. J. M. (1995). Determination of spin-dependent scattering parameters of NiFe/Cu and Co/Cu multilayers. In E. E. Marinero, B. Heinrich, & W. F. Egelhoff (editors), Magnetic ultrathin films, multilayers and surfaces : symposium held April 17-20, 1995, San Francisco, California, U.S.A. (blz. 341-346). (Materials Research Society Symposium - Proceedings; Vol. 384). Materials Research Society. https://doi.org/10.1557/PROC-384-341

Lenczowski, S.K.J. ; Gijs, M.A.M. ; van de Veerdonk, R.J.M. et al. / Determination of spin-dependent scattering parameters of NiFe/Cu and Co/Cu multilayers. Magnetic ultrathin films, multilayers and surfaces : symposium held April 17-20, 1995, San Francisco, California, U.S.A.. redacteur / E.E. Marinero ; B. Heinrich ; W.F. Egelhoff. Pitsburgh : Materials Research Society, 1995. blz. 341-346 (Materials Research Society Symposium - Proceedings).

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title = "Determination of spin-dependent scattering parameters of NiFe/Cu and Co/Cu multilayers",

abstract = "We present magnetoresistance (MR) data of high-vacuum magnetron sputtered NiFe/Cu multilayers (NiFe=NisoFe20) grown on Si(lOO) substrates with a Cu buffer layer and compare these with earlier results on Co/Cu(lOO) multilayers [1]. Measured MR values are directly proportional to the antiferromagnetically coupled fraction in the multilayers. Extrapolating to full antiparallel alignment, we can make a reliable comparison of the MR wrt,h the magnetoresistance model of Levy,Zhang, and Fert [2,3]. For the NiFe/Cu multilayers the deduced spin-asymmetry parameters are a~iFe/Cu = 5.0 ± 0.4 and a~iFe = 2.1 ± 0.3 for interface and bulk scattering, respectively. Although much smaller than in our Co/Cu multilayers, where afo/Cu = 21 ± 3 and af0 = 2.6 ± 0.3, .it is still the spin dependence of the interface scattering that is the main cause for the large MR values. ",

author = "S.K.J. Lenczowski and M.A.M. Gijs and {van de Veerdonk}, R.J.M. and J.B. Giesbers and {de Jonge}, W.J.M.",

year = "1995",

month = dec,

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doi = "10.1557/PROC-384-341",

language = "English",

isbn = "1-55899-287-1",

series = "Materials Research Society Symposium - Proceedings",

publisher = "Materials Research Society",

pages = "341--346",

editor = "E.E. Marinero and B. Heinrich and W.F. Egelhoff",

booktitle = "Magnetic ultrathin films, multilayers and surfaces : symposium held April 17-20, 1995, San Francisco, California, U.S.A.",

address = "United States",

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Lenczowski, SKJ, Gijs, MAM, van de Veerdonk, RJM, Giesbers, JB & de Jonge, WJM 1995, Determination of spin-dependent scattering parameters of NiFe/Cu and Co/Cu multilayers. in EE Marinero, B Heinrich & WF Egelhoff (uitgave), Magnetic ultrathin films, multilayers and surfaces : symposium held April 17-20, 1995, San Francisco, California, U.S.A.. Materials Research Society Symposium - Proceedings, vol. 384, Materials Research Society, Pitsburgh, blz. 341-346, 1995 MRS Spring Meeting, San Francisco, California, Verenigde Staten van Amerika, 18/04/95. https://doi.org/10.1557/PROC-384-341

Determination of spin-dependent scattering parameters of NiFe/Cu and Co/Cu multilayers. / Lenczowski, S.K.J.; Gijs, M.A.M.; van de Veerdonk, R.J.M. et al.
Magnetic ultrathin films, multilayers and surfaces : symposium held April 17-20, 1995, San Francisco, California, U.S.A.. uitgave / E.E. Marinero; B. Heinrich; W.F. Egelhoff. Pitsburgh: Materials Research Society, 1995. blz. 341-346 (Materials Research Society Symposium - Proceedings; Vol. 384).

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/Congresprocedure › Conferentiebijdrage › Academic › peer review

TY - GEN

T1 - Determination of spin-dependent scattering parameters of NiFe/Cu and Co/Cu multilayers

AU - Lenczowski, S.K.J.

AU - Gijs, M.A.M.

AU - van de Veerdonk, R.J.M.

AU - Giesbers, J.B.

AU - de Jonge, W.J.M.

PY - 1995/12/1

Y1 - 1995/12/1

N2 - We present magnetoresistance (MR) data of high-vacuum magnetron sputtered NiFe/Cu multilayers (NiFe=NisoFe20) grown on Si(lOO) substrates with a Cu buffer layer and compare these with earlier results on Co/Cu(lOO) multilayers [1]. Measured MR values are directly proportional to the antiferromagnetically coupled fraction in the multilayers. Extrapolating to full antiparallel alignment, we can make a reliable comparison of the MR wrt,h the magnetoresistance model of Levy,Zhang, and Fert [2,3]. For the NiFe/Cu multilayers the deduced spin-asymmetry parameters are a~iFe/Cu = 5.0 ± 0.4 and a~iFe = 2.1 ± 0.3 for interface and bulk scattering, respectively. Although much smaller than in our Co/Cu multilayers, where afo/Cu = 21 ± 3 and af0 = 2.6 ± 0.3, .it is still the spin dependence of the interface scattering that is the main cause for the large MR values.

AB - We present magnetoresistance (MR) data of high-vacuum magnetron sputtered NiFe/Cu multilayers (NiFe=NisoFe20) grown on Si(lOO) substrates with a Cu buffer layer and compare these with earlier results on Co/Cu(lOO) multilayers [1]. Measured MR values are directly proportional to the antiferromagnetically coupled fraction in the multilayers. Extrapolating to full antiparallel alignment, we can make a reliable comparison of the MR wrt,h the magnetoresistance model of Levy,Zhang, and Fert [2,3]. For the NiFe/Cu multilayers the deduced spin-asymmetry parameters are a~iFe/Cu = 5.0 ± 0.4 and a~iFe = 2.1 ± 0.3 for interface and bulk scattering, respectively. Although much smaller than in our Co/Cu multilayers, where afo/Cu = 21 ± 3 and af0 = 2.6 ± 0.3, .it is still the spin dependence of the interface scattering that is the main cause for the large MR values.

U2 - 10.1557/PROC-384-341

DO - 10.1557/PROC-384-341

M3 - Conference contribution

SN - 1-55899-287-1

T3 - Materials Research Society Symposium - Proceedings

SP - 341

EP - 346

BT - Magnetic ultrathin films, multilayers and surfaces : symposium held April 17-20, 1995, San Francisco, California, U.S.A.

A2 - Marinero, E.E.

A2 - Heinrich, B.

A2 - Egelhoff, W.F.

PB - Materials Research Society

CY - Pitsburgh

T2 - 1995 MRS Spring Meeting

Y2 - 18 April 1995 through 21 April 1995

ER -

Lenczowski SKJ, Gijs MAM, van de Veerdonk RJM, Giesbers JB, de Jonge WJM. Determination of spin-dependent scattering parameters of NiFe/Cu and Co/Cu multilayers. In Marinero EE, Heinrich B, Egelhoff WF, redacteurs, Magnetic ultrathin films, multilayers and surfaces : symposium held April 17-20, 1995, San Francisco, California, U.S.A.. Pitsburgh: Materials Research Society. 1995. blz. 341-346. (Materials Research Society Symposium - Proceedings). doi: 10.1557/PROC-384-341

Determination of spin-dependent scattering parameters of NiFe/Cu and Co/Cu multilayers

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