Detecting variability in MATLAB/Simulink models : an industry-inspired technique and its evaluation

A. Schlie, D. Wille, S. Schulze, L.G.W.A. Cleophas, I. Schaefer

    Onderzoeksoutput: Hoofdstuk in Boek/Rapport/CongresprocedureConferentiebijdrageAcademicpeer review

    16 Citaten (Scopus)

    Samenvatting

    Model-based languages such as MATLAB/Simulink play an essential role in the model-driven development of software systems. To comply with new requirements, it is common practice to create new variants by copying existing systems and modifying them. Commonly referred to as clone-and-own, severe problems arise in the long-run when no dedicated variability management is installed. To allow for a documented and structured reuse of systems, their variability information needs to be reverse-engineered. In this paper, we propose an advanced comparison procedure, the Matching Window Technique, and a customizable metric. Both allow us to overcome structural alterations commonly performed during clone-and-own. We analyze related MATLAB/Simulink models and determine, classify and represent their variability information in an understandable way. With our technique, we assist model engineers in maintaining and evolving existing variants. We provide three feasibility studies with real-world models from the automotive domain and show our technique to be fast and precise. Furthermore, we perform semi-structured interviews with domain experts to assess the potential applicability of our technique in practice.
    Originele taal-2Engels
    TitelSPLC '17 : Proceedings of the 21st International Systems and Software Product Line Conference, SPLC 2017, 25-29 September 2017, Sevilla, Spain,
    RedacteurenLidia Fuentes, Ebrahim Bagheri, Antonio Ruiz-Cortes, David Benavides, Rafael Capilla, Yingfei Xiong, Jan Bosch, Mathieu Acher, Daniel Schall, Myra Cohen, Javier Troya
    Plaats van productieNew York
    UitgeverijAssociation for Computing Machinery, Inc
    Pagina's215-224
    Aantal pagina's10
    VolumeA
    ISBN van elektronische versie9781450352215
    ISBN van geprinte versie978-1-4503-5221-5
    DOI's
    StatusGepubliceerd - 25 sep. 2017
    Evenement21st International Systems and Software Product Line Conference (SPLC 2017) - Sevilla, Spanje
    Duur: 25 sep. 201729 sep. 2017
    Congresnummer: 21

    Publicatie series

    NaamACM International Conference Proceeding Series
    Volume1

    Congres

    Congres21st International Systems and Software Product Line Conference (SPLC 2017)
    Verkorte titelSPLC 2017
    Land/RegioSpanje
    StadSevilla
    Periode25/09/1729/09/17

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