Samenvatting
Model-based languages such as MATLAB/Simulink play an essential role in the model-driven development of software systems. To comply with new requirements, it is common practice to create new variants by copying existing systems and modifying them. Commonly referred to as clone-and-own, severe problems arise in the long-run when no dedicated variability management is installed. To allow for a documented and structured reuse of systems, their variability information needs to be reverse-engineered. In this paper, we propose an advanced comparison procedure, the Matching Window Technique, and a customizable metric. Both allow us to overcome structural alterations commonly performed during clone-and-own. We analyze related MATLAB/Simulink models and determine, classify and represent their variability information in an understandable way. With our technique, we assist model engineers in maintaining and evolving existing variants. We provide three feasibility studies with real-world models from the automotive domain and show our technique to be fast and precise. Furthermore, we perform semi-structured interviews with domain experts to assess the potential applicability of our technique in practice.
Originele taal-2 | Engels |
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Titel | SPLC '17 : Proceedings of the 21st International Systems and Software Product Line Conference, SPLC 2017, 25-29 September 2017, Sevilla, Spain, |
Redacteuren | Lidia Fuentes, Ebrahim Bagheri, Antonio Ruiz-Cortes, David Benavides, Rafael Capilla, Yingfei Xiong, Jan Bosch, Mathieu Acher, Daniel Schall, Myra Cohen, Javier Troya |
Plaats van productie | New York |
Uitgeverij | Association for Computing Machinery, Inc |
Pagina's | 215-224 |
Aantal pagina's | 10 |
Volume | A |
ISBN van elektronische versie | 9781450352215 |
ISBN van geprinte versie | 978-1-4503-5221-5 |
DOI's | |
Status | Gepubliceerd - 25 sep. 2017 |
Evenement | 21st International Systems and Software Product Line Conference (SPLC 2017) - Sevilla, Spanje Duur: 25 sep. 2017 → 29 sep. 2017 Congresnummer: 21 |
Publicatie series
Naam | ACM International Conference Proceeding Series |
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Volume | 1 |
Congres
Congres | 21st International Systems and Software Product Line Conference (SPLC 2017) |
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Verkorte titel | SPLC 2017 |
Land/Regio | Spanje |
Stad | Sevilla |
Periode | 25/09/17 → 29/09/17 |