Design-for-testability of PLA's using statistical cooling

M.M. Ligthart, E.H.L. Aarts, F.P.M. Beenker

    Onderzoeksoutput: Hoofdstuk in Boek/Rapport/CongresprocedureConferentiebijdrageAcademicpeer review

    10 Citaten (Scopus)


    A method for designing easily testable PLA's with low overhead is presented. The method is based on a reduction of product lines and the addition of a small number of inputs. The required additional hardware is calculated using a statistical cooling algorithm. The presented design-for-testability method guarantees a 100 percent fault coverage with respect to multiple stuck-at faults and multiple missing/extra crosspoint faults.
    Originele taal-2Engels
    TitelProceedings 23rd Conference on Design Automation, 29 May-2 June, 1986
    StatusGepubliceerd - 1986


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