Design and validation of fault-tolerant embedded controllers

Saurav Kumar Ghosh, Soumyajjit Dey, Dip Goswami, Daniel Mueller-Gritschneder, Samarjit Chakraborty

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/CongresprocedureConferentiebijdrageAcademicpeer review

1 Citaat (Scopus)
2 Downloads (Pure)

Samenvatting

Embedded control systems are an important and often safety-critical class of applications that need to operate reliably even in the presence of faults. We show that intermittent fault scenarios caused by wear-out effects due to a higher density and a smaller geometry of the embedded electronic components may become a reliability concern for real-time embedded control applications. To mitigate the effects of such intermittent faults, we propose a novel fault-tolerant controller design method such that the resulting controllers ensure closed loop stability (i.e., guarantee safety) with only possibly degraded performance under such fault scenarios. In order to measure the amortized performance offered by the software implementations of such fault-tolerant controllers, we provide a program analysis methodology that statically estimates the quality of control guaranteed by the C code implementation of the fault-tolerant control law. This combination of fault-tolerant controller design followed by performance feedback computed using a formal analysis is illustrated with a case study from the automotive domain.

Originele taal-2Engels
TitelProceedings of the 2018 Design, Automation and Test in Europe Conference and Exhibition, DATE 2018
UitgeverijInstitute of Electrical and Electronics Engineers
Pagina's1283-1288
Aantal pagina's6
Volume2018-January
ISBN van elektronische versie9783981926316
DOI's
StatusGepubliceerd - 19 apr 2018
Evenement21st Design, Automation and Test in Europe Conference and Exhibition (DATE 2018) - Dresden, Duitsland
Duur: 19 mrt 201823 mrt 2018
Congresnummer: 21
https://www.date-conference.com/date18/

Congres

Congres21st Design, Automation and Test in Europe Conference and Exhibition (DATE 2018)
Verkorte titelDATE 2018
LandDuitsland
StadDresden
Periode19/03/1823/03/18
Internet adres

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  • Citeer dit

    Ghosh, S. K., Dey, S., Goswami, D., Mueller-Gritschneder, D., & Chakraborty, S. (2018). Design and validation of fault-tolerant embedded controllers. In Proceedings of the 2018 Design, Automation and Test in Europe Conference and Exhibition, DATE 2018 (Vol. 2018-January, blz. 1283-1288). Institute of Electrical and Electronics Engineers. https://doi.org/10.23919/DATE.2018.8342212