Samenvatting
The distribution of magnetic impurities (Mn) across a GaAs/Zn(Mn)Se heterovalent interface is investigated combining three experimental techniques: Cross-Section Scanning Tunnel Microscopy (X-STM), Atom Probe Tomography (APT), and Secondary Ions Mass Spectroscopy (SIMS). This unique combination allowed us to probe the Mn distribution with excellent sensitivity and sub-nanometer resolution. Our results show that the diffusion of Mn impurities in GaAs is strongly suppressed; conversely, Mn atoms are subject to a substantial redistribution in the ZnSe layer, which is affected by the growth conditions and the presence of an annealing step. These results show that it is possible to fabricate a sharp interface between a magnetic semiconductor (Zn(Mn)Se) and high quality GaAs, with low dopant concentration and good optical properties.
| Originele taal-2 | Engels |
|---|---|
| Artikelnummer | 1315 |
| Aantal pagina's | 11 |
| Tijdschrift | Nanomaterials |
| Volume | 10 |
| Nummer van het tijdschrift | 7 |
| DOI's | |
| Status | Gepubliceerd - jul. 2020 |
Financiering
Funding: D.F.G. acknowledges the support from the Dutch Foundation for Fundamental Research on Matter (FOM). P.M.Koenraad and A.Y.S. also acknowledges the financial support of the RSF (Project no. 14-42-00015) during their visit to the Ioffe Institute, when the idea behind the experiments was conceived and the samples were initially characterized.
Vingerafdruk
Duik in de onderzoeksthema's van 'Design and characterization of a sharp gaas/zn(Mn)se heterovalent interface: a sub-nanometer scale view'. Samen vormen ze een unieke vingerafdruk.Citeer dit
- APA
- Author
- BIBTEX
- Harvard
- Standard
- RIS
- Vancouver