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Design and characterization of a sharp gaas/zn(Mn)se heterovalent interface: a sub-nanometer scale view

  • Davide F. Grossi (Corresponding author)
  • , Sebastian Koelling
  • , Pavel A. Yunin
  • , Paul M. Koenraad
  • , Grigory V. Klimko
  • , Sergey V. Sorokin
  • , Mikhail N. Drozdov
  • , Sergey V. Ivanov
  • , Alexey A. Toropov
  • , Andrei Y. Silov (Corresponding author)

Onderzoeksoutput: Bijdrage aan tijdschriftTijdschriftartikelAcademicpeer review

Samenvatting

The distribution of magnetic impurities (Mn) across a GaAs/Zn(Mn)Se heterovalent interface is investigated combining three experimental techniques: Cross-Section Scanning Tunnel Microscopy (X-STM), Atom Probe Tomography (APT), and Secondary Ions Mass Spectroscopy (SIMS). This unique combination allowed us to probe the Mn distribution with excellent sensitivity and sub-nanometer resolution. Our results show that the diffusion of Mn impurities in GaAs is strongly suppressed; conversely, Mn atoms are subject to a substantial redistribution in the ZnSe layer, which is affected by the growth conditions and the presence of an annealing step. These results show that it is possible to fabricate a sharp interface between a magnetic semiconductor (Zn(Mn)Se) and high quality GaAs, with low dopant concentration and good optical properties.

Originele taal-2Engels
Artikelnummer1315
Aantal pagina's11
TijdschriftNanomaterials
Volume10
Nummer van het tijdschrift7
DOI's
StatusGepubliceerd - jul. 2020

Financiering

Funding: D.F.G. acknowledges the support from the Dutch Foundation for Fundamental Research on Matter (FOM). P.M.Koenraad and A.Y.S. also acknowledges the financial support of the RSF (Project no. 14-42-00015) during their visit to the Ioffe Institute, when the idea behind the experiments was conceived and the samples were initially characterized.

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