Demonstrating the potential of accurate absolute cross-grain stress and orientation correlation using electron backscatter diffraction

Tijmen Vermeij, Marc De Graef, Johan Hoefnagels (Corresponding author)

Onderzoeksoutput: Bijdrage aan tijdschriftTijdschriftartikelAcademicpeer review

26 Citaten (Scopus)
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Samenvatting

We report a first exploration of High-angular-Resolution Electron Backscatter Diffraction, without using simulated Electron Backscatter Diffraction patterns as a reference, for absolute stress and orientation measurements in polycrystalline materials. By co-correlating the pattern center and fully exploiting crystal symmetry and plane-stress, simultaneous correlation of all overlapping regions of interest in multiple direct-electron-detector, energy-filtered Electron Backscatter Diffraction patterns is achieved. The potential for highly accurate measurement of absolute stress, crystal orientation and pattern center is demonstrated on a virtual polycrystalline case-study, showing errors respectively below 20 MPa (or 10−4 in strain), 7 × 10−5 rad and 0.06 pixels.

Originele taal-2Engels
Pagina's (van-tot)266-271
Aantal pagina's6
TijdschriftScripta Materialia
Volume162
DOI's
StatusGepubliceerd - 15 mrt. 2019

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