Defect-location identification for cell-aware test

Zhan Gao, Santosh Malagi, Erik Jan Marinissen, Joe Swenton, Jos Huisken, Kees Goossens

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/CongresprocedureConferentiebijdrageAcademicpeer review

3 Citaten (Scopus)


Cell-aware test (CAT) explicitly targets defects inside library cells and therefore significantly reduces the amount of test escapes compared to conventional automatic test pattern generation (ATPG). Our CAT flow consists of three steps: (1) defect-location identification (DLI), (2) defect characterization based on
detailed analog simulation of the cells, and (3) cell-aware automatic test pattern generation (ATPG). This paper focuses on Step 1, as quality and cost are determined by the set of cell-internal defect locations considered in the remainder of the flow. Based on technology inputs from the user and a parasitic extraction (PEX) run that analyzes the cell layouts, we derive a set of open defects on and short defects between both transistor terminals and intra-cell interconnects. The full set of defect locations is stored for later use during failure analysis. Through dedicated DLI algorithms, we identify a compact subset of defect locations for defect characterization and ATPG, in which we include only
one representative defect location for each set of equivalent defects locations. For Cadence’s GPDK045 library, the compact subset contains only 2.8% of the full set of defect locations and reduces the time required for defect characterization with the same ratio.
Originele taal-2Engels
TitelLATS 2019 - 20th IEEE Latin American Test Symposium
Plaats van productiePiscataway
UitgeverijInstitute of Electrical and Electronics Engineers
Aantal pagina's6
ISBN van elektronische versie9781728117560
StatusGepubliceerd - 6 mei 2019
Evenement20th IEEE Latin American Test Symposium, LATS 2019 - Santiago, Chili
Duur: 11 mrt 201913 mrt 2019


Congres20th IEEE Latin American Test Symposium, LATS 2019


Citeer dit

Gao, Z., Malagi, S., Marinissen, E. J., Swenton, J., Huisken, J., & Goossens, K. (2019). Defect-location identification for cell-aware test. In LATS 2019 - 20th IEEE Latin American Test Symposium [8704561] Piscataway: Institute of Electrical and Electronics Engineers.