Decreasing the sensitivity of ADC test parameters by means of wobbling

R. De Vries, A.J.E.M. Janssen

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/CongresprocedureConferentiebijdrageAcademicpeer review

3 Citaten (Scopus)


In this paper we propose a new technique, wobbling, for the stabilization of spectral ADC-test parameters with respect to offset and amplitude deviations of the sinusoidal stimulus. Wobbling aims at removing the effect of the rounding operation that takes place in an ADC, so that the measured harmonic distortion and noise amplitude can be truly ascribed to the intrinsic non-linearity and noise of the ADC. We compare the wobbling technique with subtractive and non-subtractive noise dithering, both from a performance and an implementation point-of-view. We present results of simulations and measurements validating the wobbling technique for use in a production environment.

Originele taal-2Engels
Titel16th IEEE VLSI Test Symposium
Plaats van productiePiscataway
UitgeverijInstitute of Electrical and Electronics Engineers
Aantal pagina's6
ISBN van geprinte versie0-8186-8436-4
StatusGepubliceerd - 1 dec 1998
Extern gepubliceerdJa
Evenement1998 16th IEEE VLSI Test Symposium - Monterey, CA, USA
Duur: 26 apr 199830 apr 1998


Congres1998 16th IEEE VLSI Test Symposium
StadMonterey, CA, USA

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