Data-driven noise reduction technique for analog to digital converters

A successive operation register (SAR) analog-to-digital converter (ADC) circuit includes a bit reliability circuit that detects a delay time of the voltage comparator and, if the detected delay time is greater than a delay threshold time [tau]MV, outputs a bit reliability decision signal; a digital noise reduction circuit that is selectively activated if the bit reliability decision signal indicates the detected delay time is greater than the delay threshold time [tau]MV and produces a noise-reduced decision output that supersedes the decision output of the voltage comparator. In a preferred embodiment, the digital noise reduction circuit uses a multiple voting logic to produce a majority vote value as the noise-reduced decision output.