| Originele taal-2 | Engels |
|---|---|
| Pagina's (van-tot) | 1-7 |
| Tijdschrift | Tissue Engineering. Part C: Methods |
| Volume | 17 |
| Nummer van het tijdschrift | 1 |
| DOI's | |
| Status | Gepubliceerd - 2011 |
Citeer dit
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Cryo dualbeam focused ion beam-scanning electron microscopy to evaluate the interface between cells and nanopatterned scaffolds. / Lamers, E.; Walboomers, X.F.; Domanski, M.; McKerr, G.; O'Hagan, B.M.; Barnes, C.A.; Peto, L.; Luttge, R.; Winnubst, A.J.A.; Gardeniers, J.G.E.; Jansen, J.A.
In: Tissue Engineering. Part C: Methods, Vol. 17, Nr. 1, 2011, blz. 1-7.Onderzoeksoutput: Bijdrage aan tijdschrift › Tijdschriftartikel › Academic › peer review
TY - JOUR
T1 - Cryo dualbeam focused ion beam-scanning electron microscopy to evaluate the interface between cells and nanopatterned scaffolds
AU - Lamers, E.
AU - Walboomers, X.F.
AU - Domanski, M.
AU - McKerr, G.
AU - O'Hagan, B.M.
AU - Barnes, C.A.
AU - Peto, L.
AU - Luttge, R.
AU - Winnubst, A.J.A.
AU - Gardeniers, J.G.E.
AU - Jansen, J.A.
PY - 2011
Y1 - 2011
U2 - 10.1089/ten.tec.2010.0251
DO - 10.1089/ten.tec.2010.0251
M3 - Article
VL - 17
SP - 1
EP - 7
JO - Tissue Engineering. Part C: Methods
JF - Tissue Engineering. Part C: Methods
SN - 1937-3384
IS - 1
ER -