Creating value through test

E.J. Marinissen, B. Vermeulen, R. Madge, M. Kessler, M. Muller

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/CongresprocedureHoofdstukAcademicpeer review

3 Citaten (Scopus)

Samenvatting

Test is often seen as a necessary evil; it is a fact of life that ICs have manufacturing defects and those need to be filtered out by testing before the ICs are shipped to the customer. In this paper, we show that techniques and tools used in the testing field can also be (re-)used to create value to (1) designers, (2) manufacturers, and (3) customers alike. First, we show how the test infrastructure can be used to detect, diagnose, and correct design errors in prototype silicon. Secondly, we discuss how test results are used to improve the manufacturing process and hence production yield. Finally, we present test technologies that enable systems of high reliability for safety-critical applications.
Originele taal-2Engels
Titel2003 Design, Automation and Test in Europe Conference and Exhibition
Plaats van productiePiscataway
UitgeverijInstitute of Electrical and Electronics Engineers
Pagina's402-407
ISBN van geprinte versie0-7695-1870-2
DOI's
StatusGepubliceerd - 2003
Extern gepubliceerdJa
Evenement6th Design, Automation and Test in Europe Conference and Exhibition (DATE 2003) - Munich, Duitsland
Duur: 3 mrt. 20037 mrt. 2003

Congres

Congres6th Design, Automation and Test in Europe Conference and Exhibition (DATE 2003)
Verkorte titelDATE 2003
Land/RegioDuitsland
StadMunich
Periode3/03/037/03/03
AnderDATE'03, Munich, Germany

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