Co/X multilayers, NMR study of microscopic structure and strain

H.A.M. de Gronckel, J.A.M. Bienert, F.J.A. Broeder, den, W.J.M. Jonge, de

Onderzoeksoutput: Bijdrage aan tijdschriftTijdschriftartikelAcademicpeer review

9 Citaten (Scopus)


Co/X multilayers (X = Ir, Au, Cu, Pd) were investigated by NMR. All multilayers contained mainly fcc Co. A significant number of stacking faults is present giving a positive contribution to the magnetic volume anisotropy. In Co/Cu a linear dependence of the strain on the inverse Co thickness was observed. This might give rise to an apparent interface anisotropy. Signals due to interface atoms in Co/Cu indicate an atomic roughness of theinterfaces of about one atomic distance.
Originele taal-2Engels
Pagina's (van-tot)457-461
Aantal pagina's5
TijdschriftJournal of Magnetism and Magnetic Materials
StatusGepubliceerd - 1991


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