Coupling event domain and time domain models for manufacturing systems

J.A.W.M. Eekelen, van; A.A.J. Lefeber; J.E. Rooda

doi:10.1109/CDC.2006.377701

Coupling event domain and time domain models for manufacturing systems

J.A.W.M. Eekelen, van, A.A.J. Lefeber, J.E. Rooda

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/Congresprocedure › Conferentiebijdrage › Academic › peer review

8 Citaten (Scopus)

77 Downloads (Pure)

Samenvatting

Manufacturing systems are often characterizedas discrete event systems (DES) and consequently, these systemsare modeled with discrete event models. For certaindiscrete event modeling paradigms, control theory/techniqueshave been developed in event domain. However, from a controlor performance perspective, a lot of notions are time related,like stability, settling time, transient behavior, throughput,flow time, efficiency, etc. Moreover, if we also consider market/customer requirements, almost all requirements are withintime perspective: due dates, deliverability, earliness, tardiness,etc. Therefore, it is also useful to have time driven modelsof manufacturing systems. To combine the insights in modelingand control obtained in both time and event domain, it is usefulto create a coupling between those two domains.This paper describes modeling techniques in both timedomain and event domain for a class of manufacturing systemsand establishes a generic coupling between two model descriptions.The coupling exists of two maps between the models’states, enabling real-time control of manufacturing systems.

Originele taal-2	Engels
Titel	Proceedings of the 45th IEEE Conference on Decision and Control (CDC 2006), 13-15 December 2006, San Diego
Plaats van productie	United States, San Diego, CA
Uitgeverij	Institute of Electrical and Electronics Engineers
Pagina's	6068-6073
DOI's	https://doi.org/10.1109/CDC.2006.377701
Status	Gepubliceerd - 2006
Evenement	45th IEEE Conference on Decision and Control (CDC 2006) - San Diego, Verenigde Staten van Amerika Duur: 13 dec 2006 → 15 dec 2006 Congresnummer: 45 http://www.ieeecss.org/CAB/conferences/cdc2006/

Congres

Congres	45th IEEE Conference on Decision and Control (CDC 2006)
Verkorte titel	CDC 2006
Land	Verenigde Staten van Amerika
Stad	San Diego
Periode	13/12/06 → 15/12/06
Ander	45th IEEE Conference on Decision and Control (CDC 2006)
Internet adres	http://www.ieeecss.org/CAB/conferences/cdc2006/

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10.1109/CDC.2006.377701

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title = "Coupling event domain and time domain models for manufacturing systems",

abstract = "Manufacturing systems are often characterizedas discrete event systems (DES) and consequently, these systemsare modeled with discrete event models. For certaindiscrete event modeling paradigms, control theory/techniqueshave been developed in event domain. However, from a controlor performance perspective, a lot of notions are time related,like stability, settling time, transient behavior, throughput,flow time, efficiency, etc. Moreover, if we also consider market/customer requirements, almost all requirements are withintime perspective: due dates, deliverability, earliness, tardiness,etc. Therefore, it is also useful to have time driven modelsof manufacturing systems. To combine the insights in modelingand control obtained in both time and event domain, it is usefulto create a coupling between those two domains.This paper describes modeling techniques in both timedomain and event domain for a class of manufacturing systemsand establishes a generic coupling between two model descriptions.The coupling exists of two maps between the models{\textquoteright}states, enabling real-time control of manufacturing systems.",

author = "{Eekelen, van}, J.A.W.M. and A.A.J. Lefeber and J.E. Rooda",

year = "2006",

doi = "10.1109/CDC.2006.377701",

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Eekelen, van, JAWM , Lefeber, AAJ & Rooda, JE 2006, Coupling event domain and time domain models for manufacturing systems. in Proceedings of the 45th IEEE Conference on Decision and Control (CDC 2006), 13-15 December 2006, San Diego. Institute of Electrical and Electronics Engineers, United States, San Diego, CA, blz. 6068-6073, 45th IEEE Conference on Decision and Control (CDC 2006), San Diego, Verenigde Staten van Amerika, 13/12/06. https://doi.org/10.1109/CDC.2006.377701

Coupling event domain and time domain models for manufacturing systems. / Eekelen, van, J.A.W.M.; Lefeber, A.A.J.; Rooda, J.E.

Proceedings of the 45th IEEE Conference on Decision and Control (CDC 2006), 13-15 December 2006, San Diego. United States, San Diego, CA : Institute of Electrical and Electronics Engineers, 2006. blz. 6068-6073.

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/Congresprocedure › Conferentiebijdrage › Academic › peer review

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