Coupling event domain and time domain models for manufacturing systems

    Onderzoeksoutput: Hoofdstuk in Boek/Rapport/CongresprocedureConferentiebijdrageAcademicpeer review

    8 Citaten (Scopus)
    77 Downloads (Pure)

    Samenvatting

    Manufacturing systems are often characterizedas discrete event systems (DES) and consequently, these systemsare modeled with discrete event models. For certaindiscrete event modeling paradigms, control theory/techniqueshave been developed in event domain. However, from a controlor performance perspective, a lot of notions are time related,like stability, settling time, transient behavior, throughput,flow time, efficiency, etc. Moreover, if we also consider market/customer requirements, almost all requirements are withintime perspective: due dates, deliverability, earliness, tardiness,etc. Therefore, it is also useful to have time driven modelsof manufacturing systems. To combine the insights in modelingand control obtained in both time and event domain, it is usefulto create a coupling between those two domains.This paper describes modeling techniques in both timedomain and event domain for a class of manufacturing systemsand establishes a generic coupling between two model descriptions.The coupling exists of two maps between the models’states, enabling real-time control of manufacturing systems.
    Originele taal-2Engels
    TitelProceedings of the 45th IEEE Conference on Decision and Control (CDC 2006), 13-15 December 2006, San Diego
    Plaats van productieUnited States, San Diego, CA
    UitgeverijInstitute of Electrical and Electronics Engineers
    Pagina's6068-6073
    DOI's
    StatusGepubliceerd - 2006
    Evenement45th IEEE Conference on Decision and Control (CDC 2006) - San Diego, Verenigde Staten van Amerika
    Duur: 13 dec 200615 dec 2006
    Congresnummer: 45
    http://www.ieeecss.org/CAB/conferences/cdc2006/

    Congres

    Congres45th IEEE Conference on Decision and Control (CDC 2006)
    Verkorte titelCDC 2006
    LandVerenigde Staten van Amerika
    StadSan Diego
    Periode13/12/0615/12/06
    Ander45th IEEE Conference on Decision and Control (CDC 2006)
    Internet adres

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